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Klenov, Dmitri O., Driscoll, Daniel C., Gossard, Arthur C., Stemmer, Susanne (2005) Scanning transmission electron microscopy of ErAs nanoparticles embedded in epitaxial In0.53Ga0.47As layers. Applied Physics Letters, 86 (11). 111912pp. doi:10.1063/1.1885172

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Reference TypeJournal (article/letter/editorial)
TitleScanning transmission electron microscopy of ErAs nanoparticles embedded in epitaxial In0.53Ga0.47As layers
JournalApplied Physics Letters
AuthorsKlenov, Dmitri O.Author
Driscoll, Daniel C.Author
Gossard, Arthur C.Author
Stemmer, SusanneAuthor
Year2005 (March 14)Volume86
Issue11
PublisherAIP Publishing
DOIdoi:10.1063/1.1885172Search in ResearchGate
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Mindat Ref. ID8542024Long-form Identifiermindat:1:5:8542024:1
GUID0
Full ReferenceKlenov, Dmitri O., Driscoll, Daniel C., Gossard, Arthur C., Stemmer, Susanne (2005) Scanning transmission electron microscopy of ErAs nanoparticles embedded in epitaxial In0.53Ga0.47As layers. Applied Physics Letters, 86 (11). 111912pp. doi:10.1063/1.1885172
Plain TextKlenov, Dmitri O., Driscoll, Daniel C., Gossard, Arthur C., Stemmer, Susanne (2005) Scanning transmission electron microscopy of ErAs nanoparticles embedded in epitaxial In0.53Ga0.47As layers. Applied Physics Letters, 86 (11). 111912pp. doi:10.1063/1.1885172
In(2005, March) Applied Physics Letters Vol. 86 (11) AIP Publishing

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Klenov, Dmitri O., Zide, Joshua M., Zimmerman, Jeramy D., Gossard, Arthur C., Stemmer, Susanne (2005) Interface atomic structure of epitaxial ErAs layers on (001) In0.53Ga0.47As and GaAs. Applied Physics Letters, 86 (24). 241901pp. doi:10.1063/1.1947910
Klenov, Dmitri O., Zide, Joshua M. O., LeBeau, James M., Gossard, Arthur C., Stemmer, Susanne (2007) Ordering of ErAs nanoparticles embedded in epitaxial InGaAs layers. Applied Physics Letters, 90 (12). 121917pp. doi:10.1063/1.2715174
Klenov, D O, Driscoll, D C, Zimmerman, J D, Zide, J D, Gossard, A C, Stemmer, S (2005) Characterization of Epitaxial Semimetallic ErAs Particles in an In0.53Ga0.47As Matrix by High-Angle Annular Dark-Field Imaging. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605503805
Klenov, Dmitri O., Edge, Lisa F., Schlom, Darrell G., Stemmer, Susanne (2005) Extended defects in epitaxial Sc2O3 films grown on (111) Si. Applied Physics Letters, 86 (5). 51901pp. doi:10.1063/1.1857068
Driscoll, D. C., Hanson, M. P., Gossard, A. C., Brown, E. R. (2005) Ultrafast photoresponse at 1.55 μm in InGaAs with embedded semimetallic ErAs nanoparticles. Applied Physics Letters, 86 (5). 51908pp. doi:10.1063/1.1852092
Zide, J. M., Klenov, D. O., Stemmer, S., Gossard, A. C., Zeng, G., Bowers, J. E., Vashaee, D., Shakouri, A. (2005) Thermoelectric power factor in semiconductors with buried epitaxial semimetallic nanoparticles. Applied Physics Letters, 87 (11). 112102pp. doi:10.1063/1.2043241
Agustin, Melody P., Fonseca, Leonardo R. C., Hooker, Jacob C., Stemmer, Susanne (2005) Scanning transmission electron microscopy of gate stacks with HfO2 dielectrics and TiN electrodes. Applied Physics Letters, 87 (12). 121909pp. doi:10.1063/1.2053362
Singisetti, Uttam, Zimmerman, Jeramy D., Wistey, Mark A., Cagnon, Joël, Thibeault, Brian J., Rodwell, Mark J. W., Gossard, Arthur C., Stemmer, Susanne, Bank, Seth R. (2009) ErAs epitaxial Ohmic contacts to InGaAs/InP. Applied Physics Letters, 94 (8). 83505pp. doi:10.1063/1.3087313
Klenov, Dmitri O., Donner, Wolfgang, Foran, Brendan, Stemmer, Susanne (2003) Impact of stress on oxygen vacancy ordering in epitaxial (La0.5Sr0.5)CoO3−∂ thin films. Applied Physics Letters, 82 (20). 3427-3429 doi:10.1063/1.1575503
Klenov, Dmitri O., Mates, Thomas E., Stemmer, Susanne (2006) Detection and mobility of hafnium in SiO2. Applied Physics Letters, 89 (4). 41918pp. doi:10.1063/1.2240743
Kim, Woochul, Zide, Joshua, Gossard, Arthur, Klenov, Dmitri, Stemmer, Susanne, Shakouri, Ali, Majumdar, Arun (2006) Thermal Conductivity Reduction and Thermoelectric Figure of Merit Increase by Embedding Nanoparticles in Crystalline Semiconductors. Physical Review Letters, 96 (4). doi:10.1103/physrevlett.96.045901
 
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