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Martín-Palma, R. J., Pascual, L., Herrero, P., Martínez-Duart, J. M. (2005) Monte Carlo determination of crystallite size of porous silicon from x-ray line broadening. Applied Physics Letters, 87 (21). 211906pp. doi:10.1063/1.2133923

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Reference TypeJournal (article/letter/editorial)
TitleMonte Carlo determination of crystallite size of porous silicon from x-ray line broadening
JournalApplied Physics Letters
AuthorsMartín-Palma, R. J.Author
Pascual, L.Author
Herrero, P.Author
Martínez-Duart, J. M.Author
Year2005 (November 21)Volume87
Issue21
PublisherAIP Publishing
DOIdoi:10.1063/1.2133923Search in ResearchGate
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Mindat Ref. ID8545151Long-form Identifiermindat:1:5:8545151:5
GUID0
Full ReferenceMartín-Palma, R. J., Pascual, L., Herrero, P., Martínez-Duart, J. M. (2005) Monte Carlo determination of crystallite size of porous silicon from x-ray line broadening. Applied Physics Letters, 87 (21). 211906pp. doi:10.1063/1.2133923
Plain TextMartín-Palma, R. J., Pascual, L., Herrero, P., Martínez-Duart, J. M. (2005) Monte Carlo determination of crystallite size of porous silicon from x-ray line broadening. Applied Physics Letters, 87 (21). 211906pp. doi:10.1063/1.2133923
In(2005, November) Applied Physics Letters Vol. 87 (21) AIP Publishing

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Pascual, L., Martín-Palma, R. J., Landa-Cánovas, A. R., Herrero, P., Martínez-Duart, J. M. (2005) Lattice distortion in nanostructured porous silicon. Applied Physics Letters, 87 (25). 251921pp. doi:10.1063/1.2149973
Martín-Palma, R. J., Pascual, L., Landa, A., Herrero, P., Martínez-Duart, J. M. (2004) High-resolution transmission electron microscopic analysis of porous silicon∕silicon interface. Applied Physics Letters, 85 (13). 2517-2519 doi:10.1063/1.1797558
Martı́n-Palma, R. J., Pascual, L., Herrero, P., Martı́nez-Duart, J. M. (2002) Direct determination of grain sizes, lattice parameters, and mismatch of porous silicon. Applied Physics Letters, 81 (1). 25-27 doi:10.1063/1.1491007
Martín-Palma, R.J., Pascual, L., Landa-Cánovas, A.R., Herrero, P., Martínez-Duart, J.M. (2005) Structural modification of silicon during the formation process of porous silicon. Materials Science and Engineering: C, 25. 595-598 doi:10.1016/j.msec.2005.06.014
Martín-Palma, R. J., Manso, M., Arroyo-Hernández, M., Torres-Costa, V., Martínez-Duart, J. M. (2006) Nanostructured-porous-silicon-based two-dimensional photonic crystals. Applied Physics Letters, 89 (5). 53126pp. doi:10.1063/1.2335586
Martín-Palma, R.J., Pascual, L., Landa-Cánovas, A.R., Herrero, P., Martínez-Duart, J.M. (2006) HRTEM analysis of the nanostructure of porous silicon. Materials Science and Engineering: C, 26. 830-834 doi:10.1016/j.msec.2005.09.074
Torres-Costa, V., Martín-Palma, R. J., Martínez-Duart, J. M., Salonen, J., Lehto, V-P. (2008) Effective passivation of porous silicon optical devices by thermal carbonization. Journal of Applied Physics, 103 (8). 83124pp. doi:10.1063/1.2910459
Torres-Costa, V., Martín-Palma, R. J., Martínez-Duart, J. M. (2004) Optical constants of porous silicon films and multilayers determined by genetic algorithms. Journal of Applied Physics, 96 (8). 4197-4203 doi:10.1063/1.1786672
Guerrero-Lemus, R., Moreno, J. D., Martín-Palma, R. J., Martínez-Duart, J. M., Herrero, P., Marcos, M. L., González-Velasco, J., Gómez, P. (1997) Effect of Photoetching on Porous Silicon Morphology. Surface and Interface Analysis, 25 (9). 677-682 doi:10.1002/(sici)1096-9918(199708)25:9<677::aid-sia281>3.0.co;2-8
Bienenstock, Arthur (1961) Determination of Crystallite Size Distributions from X‐Ray Line Broadening. Journal of Applied Physics, 32 (2). 187-189 doi:10.1063/1.1735975
Torres-Costa, V., Pászti, F., Climent-Font, A., Martín-Palma, R. J., Martínez-Duart, J. M. (2005) Porosity profile determination of porous silicon interference filters by RBS. physica status solidi (c), 2 (9). 3208-3212 doi:10.1002/pssc.200461115
 
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