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Ozatay, O., Mkhoyan, K. A., Thomas, M. G., Fuchs, G. D., Silcox, J., Buhrman, R. A. (2006) Analytical electron microscopy study of growth mechanism for smoothing of metallic multilayer thin films. Applied Physics Letters, 89 (16). 162509pp. doi:10.1063/1.2358958

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Reference TypeJournal (article/letter/editorial)
TitleAnalytical electron microscopy study of growth mechanism for smoothing of metallic multilayer thin films
JournalApplied Physics Letters
AuthorsOzatay, O.Author
Mkhoyan, K. A.Author
Thomas, M. G.Author
Fuchs, G. D.Author
Silcox, J.Author
Buhrman, R. A.Author
Year2006 (October 16)Volume89
Issue16
PublisherAIP Publishing
DOIdoi:10.1063/1.2358958Search in ResearchGate
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Mindat Ref. ID8550110Long-form Identifiermindat:1:5:8550110:2
GUID0
Full ReferenceOzatay, O., Mkhoyan, K. A., Thomas, M. G., Fuchs, G. D., Silcox, J., Buhrman, R. A. (2006) Analytical electron microscopy study of growth mechanism for smoothing of metallic multilayer thin films. Applied Physics Letters, 89 (16). 162509pp. doi:10.1063/1.2358958
Plain TextOzatay, O., Mkhoyan, K. A., Thomas, M. G., Fuchs, G. D., Silcox, J., Buhrman, R. A. (2006) Analytical electron microscopy study of growth mechanism for smoothing of metallic multilayer thin films. Applied Physics Letters, 89 (16). 162509pp. doi:10.1063/1.2358958
In(2006, October) Applied Physics Letters Vol. 89 (16) AIP Publishing

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