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Jungk, Tobias, Hoffmann, Ákos, Soergel, Elisabeth (2006) Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy. Applied Physics Letters, 89 (16). 163507pp. doi:10.1063/1.2362984

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Reference TypeJournal (article/letter/editorial)
TitleQuantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy
JournalApplied Physics Letters
AuthorsJungk, TobiasAuthor
Hoffmann, ÁkosAuthor
Soergel, ElisabethAuthor
Year2006 (October 16)Volume89
Issue16
PublisherAIP Publishing
DOIdoi:10.1063/1.2362984Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8550169Long-form Identifiermindat:1:5:8550169:8
GUID0
Full ReferenceJungk, Tobias, Hoffmann, Ákos, Soergel, Elisabeth (2006) Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy. Applied Physics Letters, 89 (16). 163507pp. doi:10.1063/1.2362984
Plain TextJungk, Tobias, Hoffmann, Ákos, Soergel, Elisabeth (2006) Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy. Applied Physics Letters, 89 (16). 163507pp. doi:10.1063/1.2362984
In(2006, October) Applied Physics Letters Vol. 89 (16) AIP Publishing

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Jungk, Tobias, Hoffmann, Ákos, Soergel, Elisabeth (2006) Detection mechanism for ferroelectric domain boundaries with lateral force microscopy. Applied Physics Letters, 89 (4). 42901pp. doi:10.1063/1.2234303
Johann, Florian, Jungk, Tobias, Lilienblum, Martin, Hoffmann, Ákos, Soergel, Elisabeth (2010) Lateral signals in piezoresponse force microscopy at domain boundaries of ferroelectric crystals. Applied Physics Letters, 97 (10). 102902pp. doi:10.1063/1.3486226
Jungk, Tobias, Hoffmann, Ákos, Soergel, Elisabeth (2007) Challenges for the determination of piezoelectric constants with piezoresponse force microscopy. Applied Physics Letters, 91 (25). 253511pp. doi:10.1063/1.2827566
Jungk, Tobias, Hoffmann, Ákos, Soergel, Elisabeth (2007) Impact of elasticity on the piezoresponse of adjacent ferroelectric domains investigated by scanning force microscopy. Journal of Applied Physics, 102 (8). 84102pp. doi:10.1063/1.2795680
Johann, Florian, Ying, Yongjun J., Jungk, Tobias, Hoffmann, Ákos, Sones, Collin L., Eason, Robert W., Mailis, Sakellaris, Soergel, Elisabeth (2009) Depth resolution of piezoresponse force microscopy. Applied Physics Letters, 94 (17). 172904pp. doi:10.1063/1.3126490
Jungk, Tobias, Hoffmann, Ákos, Fiebig, Manfred, Soergel, Elisabeth (2010) Electrostatic topology of ferroelectric domains in YMnO3. Applied Physics Letters, 97 (1). 12904pp. doi:10.1063/1.3460286
Jungk, Tobias, Hoffmann, Ákos, Soergel, Elisabeth (2009) Contrast mechanisms for the detection of ferroelectric domains with scanning force microscopy. New Journal of Physics, 11. 33029pp. doi:10.1088/1367-2630/11/3/033029
Johann, F., Jungk, T., Lisinski, S., Hoffmann, Á., Ratke, L., Soergel, E. (2009) Sol-gel derived ferroelectric nanoparticles investigated by piezoresponse force microscopy. Applied Physics Letters, 95 (20). 202901pp. doi:10.1063/1.3264052
JUNGK, T., HOFFMANN, Á., SOERGEL, E. (2007) Consequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures. Journal of Microscopy, 227 (1). 72-78 doi:10.1111/j.1365-2818.2007.01783.x
Jungk, T., Soergel, E. (2005) Depth-resolved analysis of ferroelectric domain structures in bulk LiNbO3 crystals by scanning force microscopy. Applied Physics Letters, 86 (24). 242901pp. doi:10.1063/1.1949286
Johann, F., Jungk, T., Lisinski, S., Hoffmann, Á., Ratke, L., Soergel, E. (2010) Addendum: “Sol-gel synthesized ferroelectric nanoparticles investigated by piezoresponse force microscopy” [Appl. Phys. Lett. 95, 202901 (2009)]. Applied Physics Letters, 96 (13). 139901pp. doi:10.1063/1.3367754
 
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