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Heyde, M., Simon, G. H., Rust, H.-P., Freund, H.-J. (2006) Probing adsorption sites on thin oxide films by dynamic force microscopy. Applied Physics Letters, 89 (26). 263107pp. doi:10.1063/1.2424432

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Reference TypeJournal (article/letter/editorial)
TitleProbing adsorption sites on thin oxide films by dynamic force microscopy
JournalApplied Physics Letters
AuthorsHeyde, M.Author
Simon, G. H.Author
Rust, H.-P.Author
Freund, H.-J.Author
Year2006 (December 25)Volume89
Issue26
PublisherAIP Publishing
DOIdoi:10.1063/1.2424432Search in ResearchGate
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Mindat Ref. ID8551614Long-form Identifiermindat:1:5:8551614:0
GUID0
Full ReferenceHeyde, M., Simon, G. H., Rust, H.-P., Freund, H.-J. (2006) Probing adsorption sites on thin oxide films by dynamic force microscopy. Applied Physics Letters, 89 (26). 263107pp. doi:10.1063/1.2424432
Plain TextHeyde, M., Simon, G. H., Rust, H.-P., Freund, H.-J. (2006) Probing adsorption sites on thin oxide films by dynamic force microscopy. Applied Physics Letters, 89 (26). 263107pp. doi:10.1063/1.2424432
In(2006, December) Applied Physics Letters Vol. 89 (26) AIP Publishing

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König, T., Simon, G. H., Rust, H.-P., Heyde, M. (2009) Atomic resolution on a metal single crystal with dynamic force microscopy. Applied Physics Letters, 95 (8). 83116pp. doi:10.1063/1.3189282
Rust, H.-P., König, T., Simon, G. H., Nowicki, M., Simic-Milosevic, V., Thielsch, G., Heyde, M., Freund, H.-J. (2009) A portable microevaporator for low temperature single atom studies by scanning tunneling and dynamic force microscopy. Review of Scientific Instruments, 80 (11). 113705pp. doi:10.1063/1.3266971
Simon, G H, König, T, Rust, H-P, Heyde, M, Freund, H-J (2009) Atomic structure of the ultrathin alumina on NiAl(110) and its antiphase domain boundaries as seen by frequency modulation dynamic force microscopy. New Journal of Physics, 11. 93009pp. doi:10.1088/1367-2630/11/9/093009
Heyde, M., Sterrer, M., Rust, H.-P., Freund, H.-J. (2005) Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum. Applied Physics Letters, 87 (8). 83104pp. doi:10.1063/1.2012523
Simon, G. H., König, T., Nilius, M., Rust, H.-P., Heyde, M., Freund, H.-J. (2008) Atomically resolved force microscopy images of complex surface unit cells: Ultrathin alumina film on NiAl(110) Physical Review B, 78 (11) doi:10.1103/physrevb.78.113401
Heyde, M., Kulawik, M., Rust, H.-P., Freund, H.-J. (2006) Frequency-modulated atomic force spectroscopy on NiAl(110) partially covered with a thin alumina film. Physical Review B, 73 (12) doi:10.1103/physrevb.73.125320
König, T., Simon, G. H., Rust, H.-P., Heyde, M. (2009) Work Function Measurements of Thin Oxide Films on Metals—MgO on Ag(001). The Journal of Physical Chemistry C, 113 (26). 11301-11305 doi:10.1021/jp901226q
Lichtenstein, L., Büchner, C., Stuckenholz, S., Heyde, M., Freund, H.-J. (2012) Enhanced atomic corrugation in dynamic force microscopy—The role of repulsive forces. Applied Physics Letters, 100 (12). 123105pp. doi:10.1063/1.3696039
Heyde, M., Kulawik, M., Rust, H.-P., Freund, H.-J. (2004) Double quartz tuning fork sensor for low temperature atomic force and scanning tunneling microscopy. Review of Scientific Instruments, 75 (7). 2446-2450 doi:10.1063/1.1765753
Rust, H.-P., Heyde, M., Freund, H.-J. (2006) Signal electronics for an atomic force microscope equipped with a double quartz tuning fork sensor. Review of Scientific Instruments, 77 (4). 43710pp. doi:10.1063/1.2194490
Simon, G H, Heyde, M, Freund, H-J (2012) Imaging and manipulation of adatoms on an alumina surface by noncontact atomic force microscopy. Journal of Physics: Condensed Matter, 24 (8). 84007pp. doi:10.1088/0953-8984/24/8/084007
 
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