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Emadi, T. A., Bryllert, T., Sadeghi, M., Vukusic, J., Stake, J. (2007) Optimum barrier thickness study for the InGaAs∕InAlAs∕AlAs heterostructure barrier varactor diodes. Applied Physics Letters, 90 (1). 12108pp. doi:10.1063/1.2430632

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Reference TypeJournal (article/letter/editorial)
TitleOptimum barrier thickness study for the InGaAs∕InAlAs∕AlAs heterostructure barrier varactor diodes
JournalApplied Physics Letters
AuthorsEmadi, T. A.Author
Bryllert, T.Author
Sadeghi, M.Author
Vukusic, J.Author
Stake, J.Author
Year2007 (January)Volume90
Issue1
PublisherAIP Publishing
DOIdoi:10.1063/1.2430632Search in ResearchGate
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Mindat Ref. ID8552675Long-form Identifiermindat:1:5:8552675:8
GUID0
Full ReferenceEmadi, T. A., Bryllert, T., Sadeghi, M., Vukusic, J., Stake, J. (2007) Optimum barrier thickness study for the InGaAs∕InAlAs∕AlAs heterostructure barrier varactor diodes. Applied Physics Letters, 90 (1). 12108pp. doi:10.1063/1.2430632
Plain TextEmadi, T. A., Bryllert, T., Sadeghi, M., Vukusic, J., Stake, J. (2007) Optimum barrier thickness study for the InGaAs∕InAlAs∕AlAs heterostructure barrier varactor diodes. Applied Physics Letters, 90 (1). 12108pp. doi:10.1063/1.2430632
In(2007, January) Applied Physics Letters Vol. 90 (1) AIP Publishing


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