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Nishizawa, M., Bolotov, L., Kanayama, T. (2007) Simultaneous measurement of potential and dopant atom distributions on wet-prepared Si(111):H surfaces by scanning tunneling microscopy. Applied Physics Letters, 90 (12). 122118pp. doi:10.1063/1.2716837

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Reference TypeJournal (article/letter/editorial)
TitleSimultaneous measurement of potential and dopant atom distributions on wet-prepared Si(111):H surfaces by scanning tunneling microscopy
JournalApplied Physics Letters
AuthorsNishizawa, M.Author
Bolotov, L.Author
Kanayama, T.Author
Year2007 (March 19)Volume90
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.2716837Search in ResearchGate
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Mindat Ref. ID8553059Long-form Identifiermindat:1:5:8553059:3
GUID0
Full ReferenceNishizawa, M., Bolotov, L., Kanayama, T. (2007) Simultaneous measurement of potential and dopant atom distributions on wet-prepared Si(111):H surfaces by scanning tunneling microscopy. Applied Physics Letters, 90 (12). 122118pp. doi:10.1063/1.2716837
Plain TextNishizawa, M., Bolotov, L., Kanayama, T. (2007) Simultaneous measurement of potential and dopant atom distributions on wet-prepared Si(111):H surfaces by scanning tunneling microscopy. Applied Physics Letters, 90 (12). 122118pp. doi:10.1063/1.2716837
In(2007, March) Applied Physics Letters Vol. 90 (12) AIP Publishing

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Nishizawa, Masayasu, Bolotov, Leonid, Kanayama, Toshihiko (2005) Scanning Tunneling Microscopy Observation of Individual Boron Dopant Atoms beneath Si(001)-2× 1 Surfaces. Japanese Journal of Applied Physics, 44. doi:10.1143/jjap.44.l1436
Nishizawa, M, Bolotov, L, Kanayama, T (2008) Scanning tunneling microscopy/spectroscopy as an atomic-resolution dopant profiling method in Si. Journal of Physics: Conference Series, 106. 12002pp. doi:10.1088/1742-6596/106/1/012002
Fukuda, K., Nishizawa, M., Tada, T., Bolotov, L., Suzuki, K., Satoh, S., Arimoto, H., Kanayama, T. (2014) Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling. Journal of Applied Physics, 116 (2). 23701pp. doi:10.1063/1.4884876
Bolotov, Leonid, Uchida, Noriyuki, Kanayama, Toshihiko (2001) Scanning-tunneling-microscope-assisted assembling of hydrogen-saturated silicon clusters on Si(111)-(7×7) surfaces. Applied Physics Letters, 78 (23). 3720-3722 doi:10.1063/1.1377321
Bolotov, Leonid, Tada, Tetsuya, Iitake, Masanori, Nishizawa, Masayasu, Kanayama, Toshihiko (2011) Measurements of Electrostatic Potential Across p–n Junctions on Oxidized Si Surfaces by Scanning Multimode Tunneling Spectroscopy. Japanese Journal of Applied Physics, 50 (4) 4 doi:10.1143/jjap.50.04da04
Bolotov, Leonid, Tada, Tetsuya, Iitake, Masanori, Nishizawa, Masayasu, Kanayama, Toshihiko (2011) Measurements of Electrostatic Potential Across p–n Junctions on Oxidized Si Surfaces by Scanning Multimode Tunneling Spectroscopy. Japanese Journal of Applied Physics, 50 (4) 4 doi:10.7567/jjap.50.04da04
Özer, H. Özgür, O’Brien, Simon J., Pethica, John B. (2007) Local force gradients on Si(111) during simultaneous scanning tunneling/atomic force microscopy. Applied Physics Letters, 90 (13). 133110pp. doi:10.1063/1.2717115
Bolotov, Leonid, Uchida, Noriyuki, Kanayama, Toshihiko (2004) Erratum: Scanning-tunneling-microscope-assisted assembling of hydrogen-saturated silicon clusters on Si(111)‐(7×7) surfaces [Appl. Phys. Lett. 78, 3720 (2001)]. Applied Physics Letters, 85 (23). 5791 doi:10.1063/1.1835559
Bolotov, Leonid, Okui, Toshiko, Kanayama, Toshihiko (2005) Scanning resonant tunneling spectroscopy of fullerene molecules on Si surfaces for carrier density profiling across p-n junctions. Applied Physics Letters, 87 (13). 133107pp. doi:10.1063/1.2058221
Bolotov, L., Uchida, N., Kanayama, T. (2000) Scanning tunneling spectroscopy of Si6H12 clusters deposited on Si(111)-(7×7) surfaces. Surface Science, 462 (1). 85-89 doi:10.1016/s0039-6028(00)00568-9
Uchida, Noriyuki, Yahata, Hiroshi, Kanayama, Toshihiko, Bolotov, Leonid (2007) Local modification of electronic structure of Si (111)-7×7 surfaces by forming molybdenum-encapsulating Si clusters. Applied Physics Letters, 91 (6). 63109pp. doi:10.1063/1.2767205
 
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