Reference Type | Journal (article/letter/editorial) |
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Title | Critical temperatures of 70%Pb(Mg1∕3Nb2∕3)O3–30%PbTiO3 thin films investigated by dielectric, ferroelectric, and structural measurements |
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Journal | Applied Physics Letters |
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Authors | Meng, X. J. | Author |
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Rémiens, D. | Author |
Detalle, M. | Author |
Dkhil, B. | Author |
Sun, J. L. | Author |
Chu, J. H. | Author |
Year | 2007 (March 26) | Volume | 90 |
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Issue | 13 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.2716312Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8553088 | Long-form Identifier | mindat:1:5:8553088:5 |
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GUID | 0 |
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Full Reference | Meng, X. J., Rémiens, D., Detalle, M., Dkhil, B., Sun, J. L., Chu, J. H. (2007) Critical temperatures of 70%Pb(Mg1∕3Nb2∕3)O3–30%PbTiO3 thin films investigated by dielectric, ferroelectric, and structural measurements. Applied Physics Letters, 90 (13). 132904pp. doi:10.1063/1.2716312 |
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Plain Text | Meng, X. J., Rémiens, D., Detalle, M., Dkhil, B., Sun, J. L., Chu, J. H. (2007) Critical temperatures of 70%Pb(Mg1∕3Nb2∕3)O3–30%PbTiO3 thin films investigated by dielectric, ferroelectric, and structural measurements. Applied Physics Letters, 90 (13). 132904pp. doi:10.1063/1.2716312 |
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In | (2007, March) Applied Physics Letters Vol. 90 (13) AIP Publishing |
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