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Braun, K.-F., Soe, W.-H., Flipse, C. F. J., Rieder, K.-H. (2007) Electromigration of single metal atoms observed by scanning tunneling microscopy. Applied Physics Letters, 90 (2). 23118pp. doi:10.1063/1.2430102

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Reference TypeJournal (article/letter/editorial)
TitleElectromigration of single metal atoms observed by scanning tunneling microscopy
JournalApplied Physics Letters
AuthorsBraun, K.-F.Author
Soe, W.-H.Author
Flipse, C. F. J.Author
Rieder, K.-H.Author
Year2007 (January 8)Volume90
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.2430102Search in ResearchGate
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Mindat Ref. ID8554023Long-form Identifiermindat:1:5:8554023:5
GUID0
Full ReferenceBraun, K.-F., Soe, W.-H., Flipse, C. F. J., Rieder, K.-H. (2007) Electromigration of single metal atoms observed by scanning tunneling microscopy. Applied Physics Letters, 90 (2). 23118pp. doi:10.1063/1.2430102
Plain TextBraun, K.-F., Soe, W.-H., Flipse, C. F. J., Rieder, K.-H. (2007) Electromigration of single metal atoms observed by scanning tunneling microscopy. Applied Physics Letters, 90 (2). 23118pp. doi:10.1063/1.2430102
In(2007, January) Applied Physics Letters Vol. 90 (2) AIP Publishing

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