Reference Type | Journal (article/letter/editorial) |
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Title | Dynamics of bound excitons versus thickness in freestanding GaN wafers grown by halide vapor phase epitaxy |
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Journal | Applied Physics Letters |
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Authors | Pozina, G. | Author |
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Hemmingsson, C. | Author |
Bergman, J. P. | Author |
Trinh, D. | Author |
Hultman, L. | Author |
Monemar, B. | Author |
Year | 2007 (May 28) | Volume | 90 |
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Issue | 22 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.2743950Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8554356 | Long-form Identifier | mindat:1:5:8554356:0 |
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GUID | 0 |
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Full Reference | Pozina, G., Hemmingsson, C., Bergman, J. P., Trinh, D., Hultman, L., Monemar, B. (2007) Dynamics of bound excitons versus thickness in freestanding GaN wafers grown by halide vapor phase epitaxy. Applied Physics Letters, 90 (22). 221904pp. doi:10.1063/1.2743950 |
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Plain Text | Pozina, G., Hemmingsson, C., Bergman, J. P., Trinh, D., Hultman, L., Monemar, B. (2007) Dynamics of bound excitons versus thickness in freestanding GaN wafers grown by halide vapor phase epitaxy. Applied Physics Letters, 90 (22). 221904pp. doi:10.1063/1.2743950 |
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In | (2007, May) Applied Physics Letters Vol. 90 (22) AIP Publishing |
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