Reference Type | Journal (article/letter/editorial) |
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Title | Impact of interfacial roughness on tunneling conductance and extracted barrier parameters |
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Journal | Applied Physics Letters |
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Authors | Miller, Casey W. | Author |
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Li, Zhi-Pan | Author |
Åkerman, Johan | Author |
Schuller, Ivan K. | Author |
Year | 2007 (January 22) | Volume | 90 |
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Issue | 4 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.2431443Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8554974 | Long-form Identifier | mindat:1:5:8554974:0 |
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GUID | 0 |
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Full Reference | Miller, Casey W., Li, Zhi-Pan, Åkerman, Johan, Schuller, Ivan K. (2007) Impact of interfacial roughness on tunneling conductance and extracted barrier parameters. Applied Physics Letters, 90 (4). 43513pp. doi:10.1063/1.2431443 |
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Plain Text | Miller, Casey W., Li, Zhi-Pan, Åkerman, Johan, Schuller, Ivan K. (2007) Impact of interfacial roughness on tunneling conductance and extracted barrier parameters. Applied Physics Letters, 90 (4). 43513pp. doi:10.1063/1.2431443 |
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In | (2007, January) Applied Physics Letters Vol. 90 (4) AIP Publishing |
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