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Telling, N. D., Keatley, P. S., Shelford, L. R., Arenholz, E., van der Laan, G., Hicken, R. J., Sakuraba, Y., Tsunegi, S., Oogane, M., Ando, Y., Takanashi, K., Miyazaki, T. (2008) Temperature dependence of the interface moments in Co2MnSi thin films. Applied Physics Letters, 92 (19). 192503pp. doi:10.1063/1.2927482

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Reference TypeJournal (article/letter/editorial)
TitleTemperature dependence of the interface moments in Co2MnSi thin films
JournalApplied Physics Letters
AuthorsTelling, N. D.Author
Keatley, P. S.Author
Shelford, L. R.Author
Arenholz, E.Author
van der Laan, G.Author
Hicken, R. J.Author
Sakuraba, Y.Author
Tsunegi, S.Author
Oogane, M.Author
Ando, Y.Author
Takanashi, K.Author
Miyazaki, T.Author
Year2008 (May 12)Volume92
Issue19
PublisherAIP Publishing
DOIdoi:10.1063/1.2927482Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8563399Long-form Identifiermindat:1:5:8563399:7
GUID0
Full ReferenceTelling, N. D., Keatley, P. S., Shelford, L. R., Arenholz, E., van der Laan, G., Hicken, R. J., Sakuraba, Y., Tsunegi, S., Oogane, M., Ando, Y., Takanashi, K., Miyazaki, T. (2008) Temperature dependence of the interface moments in Co2MnSi thin films. Applied Physics Letters, 92 (19). 192503pp. doi:10.1063/1.2927482
Plain TextTelling, N. D., Keatley, P. S., Shelford, L. R., Arenholz, E., van der Laan, G., Hicken, R. J., Sakuraba, Y., Tsunegi, S., Oogane, M., Ando, Y., Takanashi, K., Miyazaki, T. (2008) Temperature dependence of the interface moments in Co2MnSi thin films. Applied Physics Letters, 92 (19). 192503pp. doi:10.1063/1.2927482
In(2008, May) Applied Physics Letters Vol. 92 (19) AIP Publishing


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