Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Gruverman, A., Cross, J. S., Oates, W. S. (2008) Peculiar effect of mechanical stress on polarization stability in micrometer-scale ferroelectric capacitors. Applied Physics Letters, 93 (24). 242902pp. doi:10.1063/1.3046734

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitlePeculiar effect of mechanical stress on polarization stability in micrometer-scale ferroelectric capacitors
JournalApplied Physics Letters
AuthorsGruverman, A.Author
Cross, J. S.Author
Oates, W. S.Author
Year2008 (December 15)Volume93
Issue24
PublisherAIP Publishing
DOIdoi:10.1063/1.3046734Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8570003Long-form Identifiermindat:1:5:8570003:1
GUID0
Full ReferenceGruverman, A., Cross, J. S., Oates, W. S. (2008) Peculiar effect of mechanical stress on polarization stability in micrometer-scale ferroelectric capacitors. Applied Physics Letters, 93 (24). 242902pp. doi:10.1063/1.3046734
Plain TextGruverman, A., Cross, J. S., Oates, W. S. (2008) Peculiar effect of mechanical stress on polarization stability in micrometer-scale ferroelectric capacitors. Applied Physics Letters, 93 (24). 242902pp. doi:10.1063/1.3046734
In(2008, December) Applied Physics Letters Vol. 93 (24) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Gruverman, A., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Tagantsev, A. K., Cross, J. S., Tsukada, M. (2003) Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors. Applied Physics Letters, 83 (4). 728-730 doi:10.1063/1.1593830
Rodriguez, B. J., Gruverman, A., Kingon, A. I., Nemanich, R. J., Cross, J. S. (2004) Three-dimensional high-resolution reconstruction of polarization in ferroelectric capacitors by piezoresponse force microscopy. Journal of Applied Physics, 95 (4). 1958-1962 doi:10.1063/1.1638889
Stamm, A., Kim, D. J., Lu, H., Bark, C. W., Eom, C. B., Gruverman, A. (2013) Polarization relaxation kinetics in ultrathin ferroelectric capacitors. Applied Physics Letters, 102 (9). 92901pp. doi:10.1063/1.4794865
Gruverman, A., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Cross, J. S., Tsukada, M. (2003) Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors. Applied Physics Letters, 82 (18). 3071-3073 doi:10.1063/1.1570942
Song, Jingfeng, Lu, Haidong, Gruverman, Alexei, Ducharme, S. (2014) Polarization imaging in ferroelectric polymer thin film capacitors by pyroelectric scanning microscopy. Applied Physics Letters, 104 (19). 192901pp. doi:10.1063/1.4875960
Gruverman, A., Rodriguez, B. J., Dehoff, C., Waldrep, J. D., Kingon, A. I., Nemanich, R. J., Cross, J. S. (2005) Direct studies of domain switching dynamics in thin film ferroelectric capacitors. Applied Physics Letters, 87 (8). 82902pp. doi:10.1063/1.2010605
Gruverman, Alexei (1999) Scaling effect on statistical behavior of switching parameters of ferroelectric capacitors. Applied Physics Letters, 75 (10). 1452-1454 doi:10.1063/1.124722
Kemdehoundja, M., Grosseau-Poussard, J. L., Dinhut, J. F. (2008) Substrate grain boundary effect on residual stress distribution at micrometer scale in chromia oxide thin films. Applied Physics Letters, 92 (24). 241924pp. doi:10.1063/1.2949750
Wu, D., Kunishima, I., Roberts, S., Gruverman, A. (2009) Spatial variations in local switching parameters of ferroelectric random access memory capacitors. Applied Physics Letters, 95 (9). 92901pp. doi:10.1063/1.3192354
Prasertchoung, S., Nagarajan, V., Ma, Z., Ramesh, R., Cross, J. S., Tsukada, M. (2004) Polarization switching of submicron ferroelectric capacitors using an atomic force microscope. Applied Physics Letters, 84 (16). 3130-3132 doi:10.1063/1.1707221
Toprasertpong, Kasidit, Tahara, Kento, Takenaka, Mitsuru, Takagi, Shinichi (2020) Evaluation of polarization characteristics in metal/ferroelectric/semiconductor capacitors and ferroelectric field-effect transistors. Applied Physics Letters, 116 (24) 242903pp. doi:10.1063/5.0008060
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are Β© OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 29, 2025 17:54:11
Go to top of page