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Deng, R., Yao, B., Li, Y. F., Zhao, Y. M., Li, B. H., Shan, C. X., Zhang, Z. Z., Zhao, D. X., Zhang, J. Y., Shen, D. Z., Fan, X. W. (2009) X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset. Applied Physics Letters, 94 (2). 22108pp. doi:10.1063/1.3072367

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Reference TypeJournal (article/letter/editorial)
TitleX-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset
JournalApplied Physics Letters
AuthorsDeng, R.Author
Yao, B.Author
Li, Y. F.Author
Zhao, Y. M.Author
Li, B. H.Author
Shan, C. X.Author
Zhang, Z. Z.Author
Zhao, D. X.Author
Zhang, J. Y.Author
Shen, D. Z.Author
Fan, X. W.Author
Year2009 (January 12)Volume94
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.3072367Search in ResearchGate
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Mindat Ref. ID8574129Long-form Identifiermindat:1:5:8574129:6
GUID0
Full ReferenceDeng, R., Yao, B., Li, Y. F., Zhao, Y. M., Li, B. H., Shan, C. X., Zhang, Z. Z., Zhao, D. X., Zhang, J. Y., Shen, D. Z., Fan, X. W. (2009) X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset. Applied Physics Letters, 94 (2). 22108pp. doi:10.1063/1.3072367
Plain TextDeng, R., Yao, B., Li, Y. F., Zhao, Y. M., Li, B. H., Shan, C. X., Zhang, Z. Z., Zhao, D. X., Zhang, J. Y., Shen, D. Z., Fan, X. W. (2009) X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset. Applied Physics Letters, 94 (2). 22108pp. doi:10.1063/1.3072367
In(2009, January) Applied Physics Letters Vol. 94 (2) AIP Publishing

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