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Molinero, D., Castañer, L. (2009) Modeling and measuring transient discharge current of microelectromechanical switches after dielectric charging by voltage stress. Applied Physics Letters, 94 (4). 43503pp. doi:10.1063/1.3075573

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Reference TypeJournal (article/letter/editorial)
TitleModeling and measuring transient discharge current of microelectromechanical switches after dielectric charging by voltage stress
JournalApplied Physics Letters
AuthorsMolinero, D.Author
Castañer, L.Author
Year2009 (January 26)Volume94
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.3075573Search in ResearchGate
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Mindat Ref. ID8575665Long-form Identifiermindat:1:5:8575665:0
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Full ReferenceMolinero, D., Castañer, L. (2009) Modeling and measuring transient discharge current of microelectromechanical switches after dielectric charging by voltage stress. Applied Physics Letters, 94 (4). 43503pp. doi:10.1063/1.3075573
Plain TextMolinero, D., Castañer, L. (2009) Modeling and measuring transient discharge current of microelectromechanical switches after dielectric charging by voltage stress. Applied Physics Letters, 94 (4). 43503pp. doi:10.1063/1.3075573
In(2009, January) Applied Physics Letters Vol. 94 (4) AIP Publishing

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Molinero, David, Castaner, Luis (2010) Dielectric charging characterization on microelectromechanical switches by discharge current transient. Applied Physics Letters, 96 (18). 183503pp. doi:10.1063/1.3427363
Molinero, D., Castañer, L. (2008) Comparison of air gap breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches. Applied Physics Letters, 92 (4). 43502pp. doi:10.1063/1.2837615
Molinero, D., Comulada, R., Castañer, L. (2006) Dielectric charge measurements in capacitive microelectromechanical switches. Applied Physics Letters, 89 (10). 103506pp. doi:10.1063/1.2335799
Koutsoureli, M., Papaioannou, G. (2011) Determination of long time discharge current in microelectromechanical system capacitive switches. Applied Physics Letters, 99 (10). 103503pp. doi:10.1063/1.3636405
Koutsoureli, M., Tavassolian, N., Papaioannou, G., Papapolymerou, J. (2011) Dielectric charging in capacitive microelectromechanical system switches with silicon nitride. Applied Physics Letters, 98 (9). 93505pp. doi:10.1063/1.3560465
Papaioannou, G., Papapolymerou, J., Pons, P., Plana, R. (2007) Dielectric charging in radio frequency microelectromechanical system capacitive switches: A study of material properties and device performance. Applied Physics Letters, 90 (23). 233507pp. doi:10.1063/1.2746056
Olszewski, Zbigniew, O’Mahony, Conor, Houlihan, Ruth, Duane, Russell (2009) Comment on “Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches” [Appl. Phys. Lett. 92, 043502 (2008)]. Applied Physics Letters, 95 (17). 176101pp. doi:10.1063/1.3255008
Ryan, C., Olszewski, Z., Houlihan, R., O'Mahony, C., Blake, A., Duane, R. (2015) Identification of the transient stress-induced leakage current in silicon dioxide films for use in microelectromechanical systems capacitive switches. Applied Physics Letters, 106 (17). 172904pp. doi:10.1063/1.4919718
Venkattraman, A., Garg, A., Peroulis, D., Alexeenko, A. A. (2012) Direct measurements and numerical simulations of gas charging in microelectromechanical system capacitive switches. Applied Physics Letters, 100 (8). 83503pp. doi:10.1063/1.3688176
Marcelli, Romolo, Papaioannu, George, Catoni, Simone, De Angelis, Giorgio, Lucibello, Andrea, Proietti, Emanuela, Margesin, Benno, Giacomozzi, Flavio, Deborgies, François (2009) Dielectric charging in microwave microelectromechanical Ohmic series and capacitive shunt switches. Journal of Applied Physics, 105 (11). 114514pp. doi:10.1063/1.3143026
Olszewski, Zbigniew, Duane, Russell, O’Mahony, Conor (2008) A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches. Applied Physics Letters, 93 (9). 94101pp. doi:10.1063/1.2978159
 
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