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Trunov, M. L., Lytvyn, P. M., Nagy, P. M., Dyachyns’ka, O. M. (2010) Real-time atomic force microscopy imaging of photoinduced surface deformation in AsxSe100−x chalcogenide films. Applied Physics Letters, 96 (11). 111908pp. doi:10.1063/1.3360229

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Reference TypeJournal (article/letter/editorial)
TitleReal-time atomic force microscopy imaging of photoinduced surface deformation in AsxSe100−x chalcogenide films
JournalApplied Physics Letters
AuthorsTrunov, M. L.Author
Lytvyn, P. M.Author
Nagy, P. M.Author
Dyachyns’ka, O. M.Author
Year2010 (March 15)Volume96
Issue11
PublisherAIP Publishing
DOIdoi:10.1063/1.3360229Search in ResearchGate
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Mindat Ref. ID8582065Long-form Identifiermindat:1:5:8582065:4
GUID0
Full ReferenceTrunov, M. L., Lytvyn, P. M., Nagy, P. M., Dyachyns’ka, O. M. (2010) Real-time atomic force microscopy imaging of photoinduced surface deformation in AsxSe100−x chalcogenide films. Applied Physics Letters, 96 (11). 111908pp. doi:10.1063/1.3360229
Plain TextTrunov, M. L., Lytvyn, P. M., Nagy, P. M., Dyachyns’ka, O. M. (2010) Real-time atomic force microscopy imaging of photoinduced surface deformation in AsxSe100−x chalcogenide films. Applied Physics Letters, 96 (11). 111908pp. doi:10.1063/1.3360229
In(2010, March) Applied Physics Letters Vol. 96 (11) AIP Publishing

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