Schubert, Martin F., Schubert, E. Fred (2010) Effect of heterointerface polarization charges and well width upon capture and dwell time for electrons and holes above GaInN/GaN quantum wells. Applied Physics Letters, 96 (13). 131102pp. doi:10.1063/1.3373610
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Effect of heterointerface polarization charges and well width upon capture and dwell time for electrons and holes above GaInN/GaN quantum wells | ||
Journal | Applied Physics Letters | ||
Authors | Schubert, Martin F. | Author | |
Schubert, E. Fred | Author | ||
Year | 2010 (March 29) | Volume | 96 |
Issue | 13 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.3373610Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8582389 | Long-form Identifier | mindat:1:5:8582389:1 |
GUID | 0 | ||
Full Reference | Schubert, Martin F., Schubert, E. Fred (2010) Effect of heterointerface polarization charges and well width upon capture and dwell time for electrons and holes above GaInN/GaN quantum wells. Applied Physics Letters, 96 (13). 131102pp. doi:10.1063/1.3373610 | ||
Plain Text | Schubert, Martin F., Schubert, E. Fred (2010) Effect of heterointerface polarization charges and well width upon capture and dwell time for electrons and holes above GaInN/GaN quantum wells. Applied Physics Letters, 96 (13). 131102pp. doi:10.1063/1.3373610 | ||
In | (2010, March) Applied Physics Letters Vol. 96 (13) AIP Publishing |
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