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Li, Yun, Qiu, Danfeng, Cao, Liqiang, Shao, Chenxu, Pan, Lijia, Pu, Lin, Xu, Jianbin, Shi, Yi (2010) Electrical switching behavior from ultrathin potential barrier of self-assembly molecules tuned by interfacial charge trapping. Applied Physics Letters, 96 (13). 133303pp. doi:10.1063/1.3373611

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Reference TypeJournal (article/letter/editorial)
TitleElectrical switching behavior from ultrathin potential barrier of self-assembly molecules tuned by interfacial charge trapping
JournalApplied Physics Letters
AuthorsLi, YunAuthor
Qiu, DanfengAuthor
Cao, LiqiangAuthor
Shao, ChenxuAuthor
Pan, LijiaAuthor
Pu, LinAuthor
Xu, JianbinAuthor
Shi, YiAuthor
Year2010 (March 29)Volume96
Issue13
PublisherAIP Publishing
DOIdoi:10.1063/1.3373611Search in ResearchGate
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Mindat Ref. ID8582392Long-form Identifiermindat:1:5:8582392:5
GUID0
Full ReferenceLi, Yun, Qiu, Danfeng, Cao, Liqiang, Shao, Chenxu, Pan, Lijia, Pu, Lin, Xu, Jianbin, Shi, Yi (2010) Electrical switching behavior from ultrathin potential barrier of self-assembly molecules tuned by interfacial charge trapping. Applied Physics Letters, 96 (13). 133303pp. doi:10.1063/1.3373611
Plain TextLi, Yun, Qiu, Danfeng, Cao, Liqiang, Shao, Chenxu, Pan, Lijia, Pu, Lin, Xu, Jianbin, Shi, Yi (2010) Electrical switching behavior from ultrathin potential barrier of self-assembly molecules tuned by interfacial charge trapping. Applied Physics Letters, 96 (13). 133303pp. doi:10.1063/1.3373611
In(2010, March) Applied Physics Letters Vol. 96 (13) AIP Publishing


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