Tanimura, T., Toyoda, S., Kamada, H., Kumigashira, H., Oshima, M., Sukegawa, T., Liu, G. L., Liu, Z. (2010) Photoinduced charge-trapping phenomena in metal/high-k gate stack structures studied by synchrotron radiation photoemission spectroscopy. Applied Physics Letters, 96 (16). 162902pp. doi:10.1063/1.3409162
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Photoinduced charge-trapping phenomena in metal/high-k gate stack structures studied by synchrotron radiation photoemission spectroscopy | ||
| Journal | Applied Physics Letters | ||
| Authors | Tanimura, T. | Author | |
| Toyoda, S. | Author | ||
| Kamada, H. | Author | ||
| Kumigashira, H. | Author | ||
| Oshima, M. | Author | ||
| Sukegawa, T. | Author | ||
| Liu, G. L. | Author | ||
| Liu, Z. | Author | ||
| Year | 2010 (April 19) | Volume | 96 |
| Issue | 16 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.3409162Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8583022 | Long-form Identifier | mindat:1:5:8583022:6 |
| GUID | 0 | ||
| Full Reference | Tanimura, T., Toyoda, S., Kamada, H., Kumigashira, H., Oshima, M., Sukegawa, T., Liu, G. L., Liu, Z. (2010) Photoinduced charge-trapping phenomena in metal/high-k gate stack structures studied by synchrotron radiation photoemission spectroscopy. Applied Physics Letters, 96 (16). 162902pp. doi:10.1063/1.3409162 | ||
| Plain Text | Tanimura, T., Toyoda, S., Kamada, H., Kumigashira, H., Oshima, M., Sukegawa, T., Liu, G. L., Liu, Z. (2010) Photoinduced charge-trapping phenomena in metal/high-k gate stack structures studied by synchrotron radiation photoemission spectroscopy. Applied Physics Letters, 96 (16). 162902pp. doi:10.1063/1.3409162 | ||
| In | (2010, April) Applied Physics Letters Vol. 96 (16) AIP Publishing | ||
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