Reference Type | Journal (article/letter/editorial) |
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Title | Characterization of electronic structure of silicon nanocrystals in silicon nitride by capacitance spectroscopy |
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Journal | Applied Physics Letters |
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Authors | Cho, Chang-Hee | Author |
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Kim, Baek-Hyun | Author |
Kim, Sang-Kyun | Author |
Park, Seong-Ju | Author |
Year | 2010 (May 31) | Volume | 96 |
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Issue | 22 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.3431572Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8584002 | Long-form Identifier | mindat:1:5:8584002:9 |
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GUID | 0 |
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Full Reference | Cho, Chang-Hee, Kim, Baek-Hyun, Kim, Sang-Kyun, Park, Seong-Ju (2010) Characterization of electronic structure of silicon nanocrystals in silicon nitride by capacitance spectroscopy. Applied Physics Letters, 96 (22). 223110pp. doi:10.1063/1.3431572 |
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Plain Text | Cho, Chang-Hee, Kim, Baek-Hyun, Kim, Sang-Kyun, Park, Seong-Ju (2010) Characterization of electronic structure of silicon nanocrystals in silicon nitride by capacitance spectroscopy. Applied Physics Letters, 96 (22). 223110pp. doi:10.1063/1.3431572 |
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In | (2010, May) Applied Physics Letters Vol. 96 (22) AIP Publishing |
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