Zhang, Yanliang, Hapenciuc, Claudiu L., Castillo, Eduardo E., Borca-Tasciuc, Theodorian, Mehta, Rutvik J., Karthik, Chinnathambi, Ramanath, Ganpati (2010) A microprobe technique for simultaneously measuring thermal conductivity and Seebeck coefficient of thin films. Applied Physics Letters, 96 (6). 62107pp. doi:10.1063/1.3300826
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | A microprobe technique for simultaneously measuring thermal conductivity and Seebeck coefficient of thin films | ||
| Journal | Applied Physics Letters | ||
| Authors | Zhang, Yanliang | Author | |
| Hapenciuc, Claudiu L. | Author | ||
| Castillo, Eduardo E. | Author | ||
| Borca-Tasciuc, Theodorian | Author | ||
| Mehta, Rutvik J. | Author | ||
| Karthik, Chinnathambi | Author | ||
| Ramanath, Ganpati | Author | ||
| Year | 2010 (February 8) | Volume | 96 |
| Issue | 6 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.3300826Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8585439 | Long-form Identifier | mindat:1:5:8585439:6 |
| GUID | 0 | ||
| Full Reference | Zhang, Yanliang, Hapenciuc, Claudiu L., Castillo, Eduardo E., Borca-Tasciuc, Theodorian, Mehta, Rutvik J., Karthik, Chinnathambi, Ramanath, Ganpati (2010) A microprobe technique for simultaneously measuring thermal conductivity and Seebeck coefficient of thin films. Applied Physics Letters, 96 (6). 62107pp. doi:10.1063/1.3300826 | ||
| Plain Text | Zhang, Yanliang, Hapenciuc, Claudiu L., Castillo, Eduardo E., Borca-Tasciuc, Theodorian, Mehta, Rutvik J., Karthik, Chinnathambi, Ramanath, Ganpati (2010) A microprobe technique for simultaneously measuring thermal conductivity and Seebeck coefficient of thin films. Applied Physics Letters, 96 (6). 62107pp. doi:10.1063/1.3300826 | ||
| In | (2010, February) Applied Physics Letters Vol. 96 (6) AIP Publishing | ||
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