Chen, Te-Chih, Chang, Ting-Chang, Tsai, Chih-Tsung, Hsieh, Tien-Yu, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun (2010) Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress. Applied Physics Letters, 97 (11). 112104pp. doi:10.1063/1.3481676
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress | ||
| Journal | Applied Physics Letters | ||
| Authors | Chen, Te-Chih | Author | |
| Chang, Ting-Chang | Author | ||
| Tsai, Chih-Tsung | Author | ||
| Hsieh, Tien-Yu | Author | ||
| Chen, Shih-Ching | Author | ||
| Lin, Chia-Sheng | Author | ||
| Hung, Ming-Chin | Author | ||
| Tu, Chun-Hao | Author | ||
| Chang, Jiun-Jye | Author | ||
| Chen, Po-Lun | Author | ||
| Year | 2010 (September 13) | Volume | 97 |
| Issue | 11 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.3481676Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8586426 | Long-form Identifier | mindat:1:5:8586426:9 |
| GUID | 0 | ||
| Full Reference | Chen, Te-Chih, Chang, Ting-Chang, Tsai, Chih-Tsung, Hsieh, Tien-Yu, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun (2010) Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress. Applied Physics Letters, 97 (11). 112104pp. doi:10.1063/1.3481676 | ||
| Plain Text | Chen, Te-Chih, Chang, Ting-Chang, Tsai, Chih-Tsung, Hsieh, Tien-Yu, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun (2010) Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress. Applied Physics Letters, 97 (11). 112104pp. doi:10.1063/1.3481676 | ||
| In | (2010, September) Applied Physics Letters Vol. 97 (11) AIP Publishing | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
