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Kim, Kyung Min, Lee, Min Hwan, Kim, Gun Hwan, Song, Seul Ji, Seok, Jun Yeong, Yoon, Jung Ho, Hwang, Cheol Seong (2010) Understanding structure-property relationship of resistive switching oxide thin films using a conical filament model. Applied Physics Letters, 97 (16). 162912pp. doi:10.1063/1.3505354

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Reference TypeJournal (article/letter/editorial)
TitleUnderstanding structure-property relationship of resistive switching oxide thin films using a conical filament model
JournalApplied Physics Letters
AuthorsKim, Kyung MinAuthor
Lee, Min HwanAuthor
Kim, Gun HwanAuthor
Song, Seul JiAuthor
Seok, Jun YeongAuthor
Yoon, Jung HoAuthor
Hwang, Cheol SeongAuthor
Year2010 (October 18)Volume97
Issue16
PublisherAIP Publishing
DOIdoi:10.1063/1.3505354Search in ResearchGate
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Mindat Ref. ID8587530Long-form Identifiermindat:1:5:8587530:8
GUID0
Full ReferenceKim, Kyung Min, Lee, Min Hwan, Kim, Gun Hwan, Song, Seul Ji, Seok, Jun Yeong, Yoon, Jung Ho, Hwang, Cheol Seong (2010) Understanding structure-property relationship of resistive switching oxide thin films using a conical filament model. Applied Physics Letters, 97 (16). 162912pp. doi:10.1063/1.3505354
Plain TextKim, Kyung Min, Lee, Min Hwan, Kim, Gun Hwan, Song, Seul Ji, Seok, Jun Yeong, Yoon, Jung Ho, Hwang, Cheol Seong (2010) Understanding structure-property relationship of resistive switching oxide thin films using a conical filament model. Applied Physics Letters, 97 (16). 162912pp. doi:10.1063/1.3505354
In(2010, October) Applied Physics Letters Vol. 97 (16) AIP Publishing


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