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Lakatos, A., Langer, G. A., Csik, A., Cserhati, C., Kis-Varga, M., Daroczi, L., Katona, G. L., Erdélyi, Z., Erdelyi, G., Vad, K., Beke, D. L. (2010) Nanoscale investigations of shift of individual interfaces in temperature induced processes of Ni–Si system by secondary neutral mass spectrometry. Applied Physics Letters, 97 (23). 233103pp. doi:10.1063/1.3524491

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Reference TypeJournal (article/letter/editorial)
TitleNanoscale investigations of shift of individual interfaces in temperature induced processes of Ni–Si system by secondary neutral mass spectrometry
JournalApplied Physics Letters
AuthorsLakatos, A.Author
Langer, G. A.Author
Csik, A.Author
Cserhati, C.Author
Kis-Varga, M.Author
Daroczi, L.Author
Katona, G. L.Author
Erdélyi, Z.Author
Erdelyi, G.Author
Vad, K.Author
Beke, D. L.Author
Year2010 (December 6)Volume97
Issue23
PublisherAIP Publishing
DOIdoi:10.1063/1.3524491Search in ResearchGate
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Mindat Ref. ID8588810Long-form Identifiermindat:1:5:8588810:8
GUID0
Full ReferenceLakatos, A., Langer, G. A., Csik, A., Cserhati, C., Kis-Varga, M., Daroczi, L., Katona, G. L., Erdélyi, Z., Erdelyi, G., Vad, K., Beke, D. L. (2010) Nanoscale investigations of shift of individual interfaces in temperature induced processes of Ni–Si system by secondary neutral mass spectrometry. Applied Physics Letters, 97 (23). 233103pp. doi:10.1063/1.3524491
Plain TextLakatos, A., Langer, G. A., Csik, A., Cserhati, C., Kis-Varga, M., Daroczi, L., Katona, G. L., Erdélyi, Z., Erdelyi, G., Vad, K., Beke, D. L. (2010) Nanoscale investigations of shift of individual interfaces in temperature induced processes of Ni–Si system by secondary neutral mass spectrometry. Applied Physics Letters, 97 (23). 233103pp. doi:10.1063/1.3524491
In(2010, December) Applied Physics Letters Vol. 97 (23) AIP Publishing


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