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Szkopek, Thomas (2011) The fine structure constant determines spontaneous emission rates from semiconductors. Applied Physics Letters, 98 (21). 211117pp. doi:10.1063/1.3591171

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Reference TypeJournal (article/letter/editorial)
TitleThe fine structure constant determines spontaneous emission rates from semiconductors
JournalApplied Physics Letters
AuthorsSzkopek, ThomasAuthor
Year2011 (May 23)Volume98
Issue21
PublisherAIP Publishing
DOIdoi:10.1063/1.3591171Search in ResearchGate
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Mindat Ref. ID8593196Long-form Identifiermindat:1:5:8593196:9
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Full ReferenceSzkopek, Thomas (2011) The fine structure constant determines spontaneous emission rates from semiconductors. Applied Physics Letters, 98 (21). 211117pp. doi:10.1063/1.3591171
Plain TextSzkopek, Thomas (2011) The fine structure constant determines spontaneous emission rates from semiconductors. Applied Physics Letters, 98 (21). 211117pp. doi:10.1063/1.3591171
In(2011, May) Applied Physics Letters Vol. 98 (21) AIP Publishing

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