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Fujii, Takashi, Arita, Masashi, Takahashi, Yasuo, Fujiwara, Ichiro (2011) In situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching. Applied Physics Letters, 98 (21). 212104pp. doi:10.1063/1.3593494

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Reference TypeJournal (article/letter/editorial)
TitleIn situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching
JournalApplied Physics Letters
AuthorsFujii, TakashiAuthor
Arita, MasashiAuthor
Takahashi, YasuoAuthor
Fujiwara, IchiroAuthor
Year2011 (May 23)Volume98
Issue21
PublisherAIP Publishing
DOIdoi:10.1063/1.3593494Search in ResearchGate
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Mindat Ref. ID8593286Long-form Identifiermindat:1:5:8593286:1
GUID0
Full ReferenceFujii, Takashi, Arita, Masashi, Takahashi, Yasuo, Fujiwara, Ichiro (2011) In situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching. Applied Physics Letters, 98 (21). 212104pp. doi:10.1063/1.3593494
Plain TextFujii, Takashi, Arita, Masashi, Takahashi, Yasuo, Fujiwara, Ichiro (2011) In situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching. Applied Physics Letters, 98 (21). 212104pp. doi:10.1063/1.3593494
In(2011, May) Applied Physics Letters Vol. 98 (21) AIP Publishing

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Fujii, Takashi, Arita, Masashi, Takahashi, Yasuo, Fujiwara, Ichiro (2012) Analysis of resistance switching and conductive filaments inside Cu-Ge-S using in situ transmission electron microscopy. Journal of Materials Research, 27 (6) 886-896 doi:10.1557/jmr.2011.437
Fujii, Takashi, Arita, Masashi, Hamada, Kouichi, Takahashi, Yasuo, Sakaguchi, Norihito (2013) In-situ transmission electron microscopy of conductive filaments in NiO resistance random access memory and its analysis. Journal of Applied Physics, 113 (8). 83701pp. doi:10.1063/1.4792732
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Kudo, Masaki, Arita, Masashi, Ohno, Yuuki, Takahashi, Yasuo (2014) Filament formation and erasure in molybdenum oxide during resistive switching cycles. Applied Physics Letters, 105 (17). 173504pp. doi:10.1063/1.4898773
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Muto, Satoshi, Sakai, Shinya, Tsurumaki-Fukuchi, Atsushi, Arita, Masashi, Takahashi, Yasuo (2020) Initialization process of Cu-based WO x conductive bridge RAM investigated via in situ transmission electron microscopy. Japanese Journal of Applied Physics, 59. doi:10.35848/1347-4065/ab79eb
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Arita, Masashi, Hirose, Ryusuke, Hamada, Kouichi, Takahashi, Yasuo (2006) Conductance measurements of nanoscale regions with in situ transmission electron microscopy. Materials Science and Engineering: C, 26. 776-781 doi:10.1016/j.msec.2005.09.029
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