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Douglas, E. A., Scheurmann, A., Davies, R. P., Gila, B. P., Cho, Hyun, Craciun, V., Lambers, E. S., Pearton, S. J., Ren, F. (2011) Measurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy. Applied Physics Letters, 98 (24). 242110pp. doi:10.1063/1.3600340

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Reference TypeJournal (article/letter/editorial)
TitleMeasurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy
JournalApplied Physics Letters
AuthorsDouglas, E. A.Author
Scheurmann, A.Author
Davies, R. P.Author
Gila, B. P.Author
Cho, HyunAuthor
Craciun, V.Author
Lambers, E. S.Author
Pearton, S. J.Author
Ren, F.Author
Year2011 (June 13)Volume98
Issue24
PublisherAIP Publishing
DOIdoi:10.1063/1.3600340Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8593844Long-form Identifiermindat:1:5:8593844:9
GUID0
Full ReferenceDouglas, E. A., Scheurmann, A., Davies, R. P., Gila, B. P., Cho, Hyun, Craciun, V., Lambers, E. S., Pearton, S. J., Ren, F. (2011) Measurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy. Applied Physics Letters, 98 (24). 242110pp. doi:10.1063/1.3600340
Plain TextDouglas, E. A., Scheurmann, A., Davies, R. P., Gila, B. P., Cho, Hyun, Craciun, V., Lambers, E. S., Pearton, S. J., Ren, F. (2011) Measurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy. Applied Physics Letters, 98 (24). 242110pp. doi:10.1063/1.3600340
In(2011, June) Applied Physics Letters Vol. 98 (24) AIP Publishing

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Douglas, E. A., Scheurmann, A., Davies, R. P., Gila, B. P., Cho, Hyun, Craciun, V., Lambers, E. S., Pearton, S. J., Ren, F. (2011) Erratum: “Measurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy” [Appl. Phys. Lett. 98, 242110 (2011)]. Applied Physics Letters, 99 (5). 59901pp. doi:10.1063/1.3617417
Cho, Hyun, Douglas, E. A., Gila, B. P., Craciun, V., Lambers, E. S., Ren, Fan, Pearton, S. J. (2012) Band offsets in HfO2/InGaZnO4 heterojunctions. Applied Physics Letters, 100 (1). 12105pp. doi:10.1063/1.3673905
Chen, J.-J., Gila, B. P., Hlad, M., Gerger, A., Ren, F., Abernathy, C. R., Pearton, S. J. (2006) Determination of MgO∕GaN heterojunction band offsets by x-ray photoelectron spectroscopy. Applied Physics Letters, 88 (4). 42113pp. doi:10.1063/1.2170140
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Chen, J.-J, Gila, B. P., Hlad, M., Gerger, A., Ren, F., Abernathy, C. R., Pearton, S. J. (2006) Erratum: Band offsets in the Sc2O3∕GaN heterojunction system [Appl. Phys. Lett. 88, 142115 (2006)]. Applied Physics Letters, 88 (24). 249901pp. doi:10.1063/1.2213199
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