Shin, Mincheol (2011) Intrinsic reduction of ballistic hole current due to quantum mechanical coupling of heavy and light holes in p-type Si nanowire field effect transistors. Applied Physics Letters, 99 (14). 143503pp. doi:10.1063/1.3644959
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Intrinsic reduction of ballistic hole current due to quantum mechanical coupling of heavy and light holes in p-type Si nanowire field effect transistors | ||
Journal | Applied Physics Letters | ||
Authors | Shin, Mincheol | Author | |
Year | 2011 (October 3) | Volume | 99 |
Issue | 14 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.3644959Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8596332 | Long-form Identifier | mindat:1:5:8596332:0 |
GUID | 0 | ||
Full Reference | Shin, Mincheol (2011) Intrinsic reduction of ballistic hole current due to quantum mechanical coupling of heavy and light holes in p-type Si nanowire field effect transistors. Applied Physics Letters, 99 (14). 143503pp. doi:10.1063/1.3644959 | ||
Plain Text | Shin, Mincheol (2011) Intrinsic reduction of ballistic hole current due to quantum mechanical coupling of heavy and light holes in p-type Si nanowire field effect transistors. Applied Physics Letters, 99 (14). 143503pp. doi:10.1063/1.3644959 | ||
In | (2011, October) Applied Physics Letters Vol. 99 (14) AIP Publishing |
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