Reference Type | Journal (article/letter/editorial) |
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Title | Probing bias stress effect and contact resistance in bilayer ambipolar organic field-effect transistors |
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Journal | Applied Physics Letters |
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Authors | Yan, Yan | Author |
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Sun, Qi-Jun | Author |
Gao, Xu | Author |
Deng, Ping | Author |
Zhang, Qing | Author |
Wang, Sui-Dong | Author |
Year | 2013 (August 12) | Volume | 103 |
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Issue | 7 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.4818644Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8620906 | Long-form Identifier | mindat:1:5:8620906:1 |
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GUID | 0 |
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Full Reference | Yan, Yan, Sun, Qi-Jun, Gao, Xu, Deng, Ping, Zhang, Qing, Wang, Sui-Dong (2013) Probing bias stress effect and contact resistance in bilayer ambipolar organic field-effect transistors. Applied Physics Letters, 103 (7). 73303pp. doi:10.1063/1.4818644 |
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Plain Text | Yan, Yan, Sun, Qi-Jun, Gao, Xu, Deng, Ping, Zhang, Qing, Wang, Sui-Dong (2013) Probing bias stress effect and contact resistance in bilayer ambipolar organic field-effect transistors. Applied Physics Letters, 103 (7). 73303pp. doi:10.1063/1.4818644 |
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In | (2013, August) Applied Physics Letters Vol. 103 (7) AIP Publishing |
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