Shim, Yun-Pil, Ruskov, Rusko, Hurst, Hilary M., Tahan, Charles (2019) Induced quantum dot probe for material characterization. Applied Physics Letters, 114 (15). 152105pp. doi:10.1063/1.5053756
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Induced quantum dot probe for material characterization | ||
Journal | Applied Physics Letters | ||
Authors | Shim, Yun-Pil | Author | |
Ruskov, Rusko | Author | ||
Hurst, Hilary M. | Author | ||
Tahan, Charles | Author | ||
Year | 2019 (April 15) | Volume | 114 |
Issue | 15 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.5053756Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8656246 | Long-form Identifier | mindat:1:5:8656246:5 |
GUID | 0 | ||
Full Reference | Shim, Yun-Pil, Ruskov, Rusko, Hurst, Hilary M., Tahan, Charles (2019) Induced quantum dot probe for material characterization. Applied Physics Letters, 114 (15). 152105pp. doi:10.1063/1.5053756 | ||
Plain Text | Shim, Yun-Pil, Ruskov, Rusko, Hurst, Hilary M., Tahan, Charles (2019) Induced quantum dot probe for material characterization. Applied Physics Letters, 114 (15). 152105pp. doi:10.1063/1.5053756 | ||
In | (2019, April) Applied Physics Letters Vol. 114 (15) AIP Publishing |
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