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Arai, Ryoji, Nishi, Toshio, Kudo, Yoshihiro, Yoshida, Hiroyuki, Tomiya, Shigetaka (2019) Effects of gas cluster ion beam sputtering on the molecular orientation of organic semiconductor films: Ultraviolet photoelectron spectroscopy study of [6]phenacene. Applied Physics Letters, 114 (23). 231603pp. doi:10.1063/1.5094952

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Reference TypeJournal (article/letter/editorial)
TitleEffects of gas cluster ion beam sputtering on the molecular orientation of organic semiconductor films: Ultraviolet photoelectron spectroscopy study of [6]phenacene
JournalApplied Physics Letters
AuthorsArai, RyojiAuthor
Nishi, ToshioAuthor
Kudo, YoshihiroAuthor
Yoshida, HiroyukiAuthor
Tomiya, ShigetakaAuthor
Year2019 (June 10)Volume114
Issue23
PublisherAIP Publishing
DOIdoi:10.1063/1.5094952Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8657072Long-form Identifiermindat:1:5:8657072:9
GUID0
Full ReferenceArai, Ryoji, Nishi, Toshio, Kudo, Yoshihiro, Yoshida, Hiroyuki, Tomiya, Shigetaka (2019) Effects of gas cluster ion beam sputtering on the molecular orientation of organic semiconductor films: Ultraviolet photoelectron spectroscopy study of [6]phenacene. Applied Physics Letters, 114 (23). 231603pp. doi:10.1063/1.5094952
Plain TextArai, Ryoji, Nishi, Toshio, Kudo, Yoshihiro, Yoshida, Hiroyuki, Tomiya, Shigetaka (2019) Effects of gas cluster ion beam sputtering on the molecular orientation of organic semiconductor films: Ultraviolet photoelectron spectroscopy study of [6]phenacene. Applied Physics Letters, 114 (23). 231603pp. doi:10.1063/1.5094952
In(2019, June) Applied Physics Letters Vol. 114 (23) AIP Publishing

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