Usami, Shigeyoshi, Mayama, Norihito, Toda, Kazuya, Tanaka, Atsushi, Deki, Manato, Nitta, Shugo, Honda, Yoshio, Amano, Hiroshi (2019) Direct evidence of Mg diffusion through threading mixed dislocations in GaN p–n diodes and its effect on reverse leakage current. Applied Physics Letters, 114 (23). 232105pp. doi:10.1063/1.5097767
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Direct evidence of Mg diffusion through threading mixed dislocations in GaN p–n diodes and its effect on reverse leakage current | ||
| Journal | Applied Physics Letters | ||
| Authors | Usami, Shigeyoshi | Author | |
| Mayama, Norihito | Author | ||
| Toda, Kazuya | Author | ||
| Tanaka, Atsushi | Author | ||
| Deki, Manato | Author | ||
| Nitta, Shugo | Author | ||
| Honda, Yoshio | Author | ||
| Amano, Hiroshi | Author | ||
| Year | 2019 (June 10) | Volume | 114 |
| Issue | 23 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.5097767Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8657112 | Long-form Identifier | mindat:1:5:8657112:6 |
| GUID | 0 | ||
| Full Reference | Usami, Shigeyoshi, Mayama, Norihito, Toda, Kazuya, Tanaka, Atsushi, Deki, Manato, Nitta, Shugo, Honda, Yoshio, Amano, Hiroshi (2019) Direct evidence of Mg diffusion through threading mixed dislocations in GaN p–n diodes and its effect on reverse leakage current. Applied Physics Letters, 114 (23). 232105pp. doi:10.1063/1.5097767 | ||
| Plain Text | Usami, Shigeyoshi, Mayama, Norihito, Toda, Kazuya, Tanaka, Atsushi, Deki, Manato, Nitta, Shugo, Honda, Yoshio, Amano, Hiroshi (2019) Direct evidence of Mg diffusion through threading mixed dislocations in GaN p–n diodes and its effect on reverse leakage current. Applied Physics Letters, 114 (23). 232105pp. doi:10.1063/1.5097767 | ||
| In | (2019, June) Applied Physics Letters Vol. 114 (23) AIP Publishing | ||
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