Schiff, E A (2004) Drift-mobility measurements and mobility edges in disordered silicons. Journal of Physics: Condensed Matter, 16 (44). doi:10.1088/0953-8984/16/44/023
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Drift-mobility measurements and mobility edges in disordered silicons | ||
Journal | Journal of Physics: Condensed Matter | ||
Authors | Schiff, E A | Author | |
Year | 2004 (November 10) | Volume | 16 |
Issue | 44 | ||
Publisher | IOP Publishing | ||
DOI | doi:10.1088/0953-8984/16/44/023Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8698512 | Long-form Identifier | mindat:1:5:8698512:5 |
GUID | 0 | ||
Full Reference | Schiff, E A (2004) Drift-mobility measurements and mobility edges in disordered silicons. Journal of Physics: Condensed Matter, 16 (44). doi:10.1088/0953-8984/16/44/023 | ||
Plain Text | Schiff, E A (2004) Drift-mobility measurements and mobility edges in disordered silicons. Journal of Physics: Condensed Matter, 16 (44). doi:10.1088/0953-8984/16/44/023 | ||
In | (2004, November) Journal of Physics: Condensed Matter Vol. 16 (44) IOP Publishing |
See Also
These are possibly similar items as determined by title/reference text matching only.
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() |