Reference Type | Journal (article/letter/editorial) |
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Title | Screening of charged impurities in semiconductors in intense magnetic fields. II. The effect of scattering |
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Journal | Journal of Physics C: Solid State Physics |
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Authors | Jog, S D | Author |
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Wallace, P R | Author |
Year | 1975 (November 7) | Volume | 8 |
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Issue | 21 |
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Publisher | IOP Publishing |
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DOI | doi:10.1088/0022-3719/8/21/030Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8890102 | Long-form Identifier | mindat:1:5:8890102:0 |
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|
GUID | 0 |
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Full Reference | Jog, S D, Wallace, P R (1975) Screening of charged impurities in semiconductors in intense magnetic fields. II. The effect of scattering. Journal of Physics C: Solid State Physics, 8 (21). 3608-3614 doi:10.1088/0022-3719/8/21/030 |
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Plain Text | Jog, S D, Wallace, P R (1975) Screening of charged impurities in semiconductors in intense magnetic fields. II. The effect of scattering. Journal of Physics C: Solid State Physics, 8 (21). 3608-3614 doi:10.1088/0022-3719/8/21/030 |
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In | (1975, November) Journal of Physics C: Solid State Physics Vol. 8 (21) IOP Publishing |
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