Kouimtzi, S D (1982) Evidence of a shallow radiation-induced defect level in n-type silicon. Journal of Physics C: Solid State Physics, 15 (10). 2169-2172 doi:10.1088/0022-3719/15/10/017
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Evidence of a shallow radiation-induced defect level in n-type silicon | ||
Journal | Journal of Physics C: Solid State Physics | ||
Authors | Kouimtzi, S D | Author | |
Year | 1982 (April 10) | Volume | 15 |
Issue | 10 | ||
Publisher | IOP Publishing | ||
DOI | doi:10.1088/0022-3719/15/10/017Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8894570 | Long-form Identifier | mindat:1:5:8894570:5 |
GUID | 0 | ||
Full Reference | Kouimtzi, S D (1982) Evidence of a shallow radiation-induced defect level in n-type silicon. Journal of Physics C: Solid State Physics, 15 (10). 2169-2172 doi:10.1088/0022-3719/15/10/017 | ||
Plain Text | Kouimtzi, S D (1982) Evidence of a shallow radiation-induced defect level in n-type silicon. Journal of Physics C: Solid State Physics, 15 (10). 2169-2172 doi:10.1088/0022-3719/15/10/017 | ||
In | (1982, April) Journal of Physics C: Solid State Physics Vol. 15 (10) IOP Publishing |
See Also
These are possibly similar items as determined by title/reference text matching only.
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() |