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Kouimtzi, S D (1982) Evidence of a shallow radiation-induced defect level in n-type silicon. Journal of Physics C: Solid State Physics, 15 (10). 2169-2172 doi:10.1088/0022-3719/15/10/017

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Reference TypeJournal (article/letter/editorial)
TitleEvidence of a shallow radiation-induced defect level in n-type silicon
JournalJournal of Physics C: Solid State Physics
AuthorsKouimtzi, S DAuthor
Year1982 (April 10)Volume15
Issue10
PublisherIOP Publishing
DOIdoi:10.1088/0022-3719/15/10/017Search in ResearchGate
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Mindat Ref. ID8894570Long-form Identifiermindat:1:5:8894570:5
GUID0
Full ReferenceKouimtzi, S D (1982) Evidence of a shallow radiation-induced defect level in n-type silicon. Journal of Physics C: Solid State Physics, 15 (10). 2169-2172 doi:10.1088/0022-3719/15/10/017
Plain TextKouimtzi, S D (1982) Evidence of a shallow radiation-induced defect level in n-type silicon. Journal of Physics C: Solid State Physics, 15 (10). 2169-2172 doi:10.1088/0022-3719/15/10/017
In(1982, April) Journal of Physics C: Solid State Physics Vol. 15 (10) IOP Publishing


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