Reference Type | Journal (article/letter/editorial) |
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Title | To: “High‐resolution common‐depth‐point reflection profiling: Field acquisition parameter design,” by R. W. Knapp and D. W. Steeples, which appeared in February 1986, GEOPHYSICS, p. 283–294 |
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Journal | Geophysics |
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Year | 1986 (July) | Volume | 51 |
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Issue | 7 |
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Publisher | Society of Exploration Geophysicists |
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DOI | doi:10.1190/1.1442202Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 897240 | Long-form Identifier | mindat:1:5:897240:2 |
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GUID | 0 |
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Full Reference | (1986) To: “High‐resolution common‐depth‐point reflection profiling: Field acquisition parameter design,” by R. W. Knapp and D. W. Steeples, which appeared in February 1986, GEOPHYSICS, p. 283–294. Geophysics, 51 (7) 1519 doi:10.1190/1.1442202 |
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Plain Text | (1986) To: “High‐resolution common‐depth‐point reflection profiling: Field acquisition parameter design,” by R. W. Knapp and D. W. Steeples, which appeared in February 1986, GEOPHYSICS, p. 283–294. Geophysics, 51 (7) 1519 doi:10.1190/1.1442202 |
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In | (1986, July) Geophysics Vol. 51 (7) Society of Exploration Geophysicists |
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