Reference Type | Journal (article/letter/editorial) |
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Title | Enhanced sensitivity of Z-scan technique by use of flat-topped beam |
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Journal | Applied Physics B |
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Authors | Wang, J. | Author |
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Gu, B. | Author |
Xu, Y. M. | Author |
Wang, H. T. | Author |
Year | 2009 (June) | Volume | 95 |
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Issue | 4 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/s00340-009-3547-3Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9020698 | Long-form Identifier | mindat:1:5:9020698:2 |
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GUID | 0 |
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Full Reference | Wang, J., Gu, B., Xu, Y. M., Wang, H. T. (2009) Enhanced sensitivity of Z-scan technique by use of flat-topped beam. Applied Physics B, 95 (4). 773-778 doi:10.1007/s00340-009-3547-3 |
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Plain Text | Wang, J., Gu, B., Xu, Y. M., Wang, H. T. (2009) Enhanced sensitivity of Z-scan technique by use of flat-topped beam. Applied Physics B, 95 (4). 773-778 doi:10.1007/s00340-009-3547-3 |
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In | (2009, June) Applied Physics B Vol. 95 (4) Springer Science and Business Media LLC |
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