Reference Type | Journal (article/letter/editorial) |
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Title | Absolute SiO concentration imaging in low-pressure nanoparticle-synthesis flames via laser-induced fluorescence |
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Journal | Applied Physics B |
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Authors | Chrystie, Robin S. M. | Author |
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Ebertz, Felix L. | Author |
Dreier, Thomas | Author |
Schulz, Christof | Author |
Year | 2019 (February) | Volume | 125 |
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Issue | 2 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/s00340-019-7137-8Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9024517 | Long-form Identifier | mindat:1:5:9024517:6 |
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GUID | 0 |
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Full Reference | Chrystie, Robin S. M., Ebertz, Felix L., Dreier, Thomas, Schulz, Christof (2019) Absolute SiO concentration imaging in low-pressure nanoparticle-synthesis flames via laser-induced fluorescence. Applied Physics B, 125 (2). doi:10.1007/s00340-019-7137-8 |
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Plain Text | Chrystie, Robin S. M., Ebertz, Felix L., Dreier, Thomas, Schulz, Christof (2019) Absolute SiO concentration imaging in low-pressure nanoparticle-synthesis flames via laser-induced fluorescence. Applied Physics B, 125 (2). doi:10.1007/s00340-019-7137-8 |
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In | (2019, February) Applied Physics B Vol. 125 (2) Springer Science and Business Media LLC |
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