Park, T.-S., Suresh, S., Rosakis, A.J., Ryu, J. (2003) Measurement of full-field curvature and geometrical instability of thin film-substrate systems through CGS interferometry. Journal of the Mechanics and Physics of Solids, 51 (11). 2191-2211 doi:10.1016/j.jmps.2003.09.031
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Measurement of full-field curvature and geometrical instability of thin film-substrate systems through CGS interferometry | ||
Journal | Journal of the Mechanics and Physics of Solids | ||
Authors | Park, T.-S. | Author | |
Suresh, S. | Author | ||
Rosakis, A.J. | Author | ||
Ryu, J. | Author | ||
Year | 2003 (November) | Volume | 51 |
Issue | 11 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.jmps.2003.09.031Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9046957 | Long-form Identifier | mindat:1:5:9046957:2 |
GUID | 0 | ||
Full Reference | Park, T.-S., Suresh, S., Rosakis, A.J., Ryu, J. (2003) Measurement of full-field curvature and geometrical instability of thin film-substrate systems through CGS interferometry. Journal of the Mechanics and Physics of Solids, 51 (11). 2191-2211 doi:10.1016/j.jmps.2003.09.031 | ||
Plain Text | Park, T.-S., Suresh, S., Rosakis, A.J., Ryu, J. (2003) Measurement of full-field curvature and geometrical instability of thin film-substrate systems through CGS interferometry. Journal of the Mechanics and Physics of Solids, 51 (11). 2191-2211 doi:10.1016/j.jmps.2003.09.031 | ||
In | (2003, November) Journal of the Mechanics and Physics of Solids Vol. 51 (11) Elsevier BV |
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