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Juneja, Sucheta, Sudhakar, S., Lodhi, Kalpana, Sharma, Mansi, Kumar, Sushil (2014) Kinetics of Recovery of Light Induced Defects on Thermal Annealing Towards Stability of Microcrystalline Silicon Films. Advanced Science Letters, 20 (7). 1499-1503 doi:10.1166/asl.2014.5580

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Reference TypeJournal (article/letter/editorial)
TitleKinetics of Recovery of Light Induced Defects on Thermal Annealing Towards Stability of Microcrystalline Silicon Films
JournalAdvanced Science Letters
AuthorsJuneja, SuchetaAuthor
Sudhakar, S.Author
Lodhi, KalpanaAuthor
Sharma, MansiAuthor
Kumar, SushilAuthor
Year2014 (July 1)Volume20
Issue7
PublisherAmerican Scientific Publishers
DOIdoi:10.1166/asl.2014.5580Search in ResearchGate
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Mindat Ref. ID9204865Long-form Identifiermindat:1:5:9204865:6
GUID0
Full ReferenceJuneja, Sucheta, Sudhakar, S., Lodhi, Kalpana, Sharma, Mansi, Kumar, Sushil (2014) Kinetics of Recovery of Light Induced Defects on Thermal Annealing Towards Stability of Microcrystalline Silicon Films. Advanced Science Letters, 20 (7). 1499-1503 doi:10.1166/asl.2014.5580
Plain TextJuneja, Sucheta, Sudhakar, S., Lodhi, Kalpana, Sharma, Mansi, Kumar, Sushil (2014) Kinetics of Recovery of Light Induced Defects on Thermal Annealing Towards Stability of Microcrystalline Silicon Films. Advanced Science Letters, 20 (7). 1499-1503 doi:10.1166/asl.2014.5580
In(2014, July) Advanced Science Letters Vol. 20 (7) American Scientific Publishers

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Surbhi, ., Saruchi, ., Kumar, Sushil (2014) Effect of Annealing Temperature on Structural, Photoluminescence and Thermal Properties of Nanosized Zirconium Silicates. Advanced Science Letters, 20 (7). 1504-1508 doi:10.1166/asl.2014.5586
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Kumar, Anjani, Kumar, D, Shukla, R. K, Kumar, A (2016) Applicability of Thermally Stimulated Currents Technique to Estimate Light Induced Meta-Stable Defects in A-Se90In2Ag8 Thin Films. Advanced Science Letters, 22 (11). 3954-3957 doi:10.1166/asl.2016.8035
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