Lim, Hee-Jeong, Sun, Jianguo (2003) Nonparametric Tests for Interval-Censored Failure Time Data. Biometrical Journal, 45 (3). 263-276 doi:10.1002/bimj.200390011
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Nonparametric Tests for Interval-Censored Failure Time Data | ||
Journal | Biometrical Journal | ||
Authors | Lim, Hee-Jeong | Author | |
Sun, Jianguo | Author | ||
Year | 2003 (April) | Volume | 45 |
Issue | 3 | ||
Publisher | Wiley | ||
DOI | doi:10.1002/bimj.200390011Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9296099 | Long-form Identifier | mindat:1:5:9296099:6 |
GUID | 0 | ||
Full Reference | Lim, Hee-Jeong, Sun, Jianguo (2003) Nonparametric Tests for Interval-Censored Failure Time Data. Biometrical Journal, 45 (3). 263-276 doi:10.1002/bimj.200390011 | ||
Plain Text | Lim, Hee-Jeong, Sun, Jianguo (2003) Nonparametric Tests for Interval-Censored Failure Time Data. Biometrical Journal, 45 (3). 263-276 doi:10.1002/bimj.200390011 | ||
In | (2003, April) Biometrical Journal Vol. 45 (3) Wiley |
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