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Sakata, Yukinobu, Kaneko, Shuni’chi, Takagi, Yuji, Okuda, Hirohito (2005) Successive pattern classification based on test feature classifier and its application to defect image classification. Pattern Recognition, 38 (11). 1847-1856 doi:10.1016/j.patcog.2005.04.013

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Reference TypeJournal (article/letter/editorial)
TitleSuccessive pattern classification based on test feature classifier and its application to defect image classification
JournalPattern Recognition
AuthorsSakata, YukinobuAuthor
Kaneko, Shuni’chiAuthor
Takagi, YujiAuthor
Okuda, HirohitoAuthor
Year2005 (November)Volume38
Issue11
PublisherElsevier BV
DOIdoi:10.1016/j.patcog.2005.04.013Search in ResearchGate
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Mindat Ref. ID9362802Long-form Identifiermindat:1:5:9362802:4
GUID0
Full ReferenceSakata, Yukinobu, Kaneko, Shuni’chi, Takagi, Yuji, Okuda, Hirohito (2005) Successive pattern classification based on test feature classifier and its application to defect image classification. Pattern Recognition, 38 (11). 1847-1856 doi:10.1016/j.patcog.2005.04.013
Plain TextSakata, Yukinobu, Kaneko, Shuni’chi, Takagi, Yuji, Okuda, Hirohito (2005) Successive pattern classification based on test feature classifier and its application to defect image classification. Pattern Recognition, 38 (11). 1847-1856 doi:10.1016/j.patcog.2005.04.013
In(2005, November) Pattern Recognition Vol. 38 (11) Elsevier BV

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