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Nguyen, Bac, Morell, Carlos, De Baets, Bernard (2017) Supervised distance metric learning through maximization of the Jeffrey divergence. Pattern Recognition, 64. 215-225 doi:10.1016/j.patcog.2016.11.010

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Reference TypeJournal (article/letter/editorial)
TitleSupervised distance metric learning through maximization of the Jeffrey divergence
JournalPattern Recognition
AuthorsNguyen, BacAuthor
Morell, CarlosAuthor
De Baets, BernardAuthor
Year2017 (April)Volume64
PublisherElsevier BV
DOIdoi:10.1016/j.patcog.2016.11.010Search in ResearchGate
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Mindat Ref. ID9366850Long-form Identifiermindat:1:5:9366850:9
GUID0
Full ReferenceNguyen, Bac, Morell, Carlos, De Baets, Bernard (2017) Supervised distance metric learning through maximization of the Jeffrey divergence. Pattern Recognition, 64. 215-225 doi:10.1016/j.patcog.2016.11.010
Plain TextNguyen, Bac, Morell, Carlos, De Baets, Bernard (2017) Supervised distance metric learning through maximization of the Jeffrey divergence. Pattern Recognition, 64. 215-225 doi:10.1016/j.patcog.2016.11.010
In(2017) Pattern Recognition Vol. 64. Elsevier BV

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Nguyen, Bac, De Baets, Bernard (2018) An approach to supervised distance metric learning based on difference of convex functions programming. Pattern Recognition, 81. 562-574 doi:10.1016/j.patcog.2018.04.024
Nguyen, Bac, Ferri, Francesc J., Morell, Carlos, De Baets, Bernard (2019) An efficient method for clustered multi-metric learning. Information Sciences, 471. 149-163 doi:10.1016/j.ins.2018.08.055
Wang, Chen, Peng, Guohua, De Baets, Bernard (2022) Class-specific discriminative metric learning for scene recognition. Pattern Recognition, 126. 108589pp. doi:10.1016/j.patcog.2022.108589
Yu, Yaoliang, Jiang, Jiayan, Zhang, Liming (2011) Distance metric learning by minimal distance maximization. Pattern Recognition, 44 (3). 639-649 doi:10.1016/j.patcog.2010.09.019
Chang, Chin-Chun (2010) Generalized iterative RELIEF for supervised distance metric learning. Pattern Recognition, 43 (8). 2971-2981 doi:10.1016/j.patcog.2010.02.024
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Yan, Haibin, Hu, Junlin (2018) Video-based kinship verification using distance metric learning. Pattern Recognition, 75. 15-24 doi:10.1016/j.patcog.2017.03.001
Wang, Qianying, Yuen, Pong C, Feng, Guocan (2013) Semi-supervised metric learning via topology preserving multiple semi-supervised assumptions. Pattern Recognition, 46 (9). 2576-2587 doi:10.1016/j.patcog.2013.02.015
Wang, Qi, Wan, Jia, Yuan, Yuan (2018) Locality constraint distance metric learning for traffic congestion detection. Pattern Recognition, 75. 272-281 doi:10.1016/j.patcog.2017.03.030
Scabini, Leonardo, Zielinski, Kallil M., Ribas, Lucas C., Gonçalves, Wesley N., De Baets, Bernard, Bruno, Odemir M. (2023) RADAM: Texture recognition through randomized aggregated encoding of deep activation maps. Pattern Recognition, 143. Elsevier BV. 109802 doi:10.1016/j.patcog.2023.109802
 
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