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Nguyen, Kien, Fookes, Clinton, Sridharan, Sridha, Tistarelli, Massimo, Nixon, Mark (2018) Super-resolution for biometrics: A comprehensive survey. Pattern Recognition, 78. 23-42 doi:10.1016/j.patcog.2018.01.002

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Reference TypeJournal (article/letter/editorial)
TitleSuper-resolution for biometrics: A comprehensive survey
JournalPattern Recognition
AuthorsNguyen, KienAuthor
Fookes, ClintonAuthor
Sridharan, SridhaAuthor
Tistarelli, MassimoAuthor
Nixon, MarkAuthor
Year2018 (June)Volume78
PublisherElsevier BV
DOIdoi:10.1016/j.patcog.2018.01.002Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9367334Long-form Identifiermindat:1:5:9367334:3
GUID0
Full ReferenceNguyen, Kien, Fookes, Clinton, Sridharan, Sridha, Tistarelli, Massimo, Nixon, Mark (2018) Super-resolution for biometrics: A comprehensive survey. Pattern Recognition, 78. 23-42 doi:10.1016/j.patcog.2018.01.002
Plain TextNguyen, Kien, Fookes, Clinton, Sridharan, Sridha, Tistarelli, Massimo, Nixon, Mark (2018) Super-resolution for biometrics: A comprehensive survey. Pattern Recognition, 78. 23-42 doi:10.1016/j.patcog.2018.01.002
In(2018) Pattern Recognition Vol. 78. Elsevier BV

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