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Heisel, M., Kaether, F., Simgen, H. (2009) Statistical analysis of low-level material screening measurements via gamma-spectroscopy. Applied Radiation and Isotopes, 67. 741-745 doi:10.1016/j.apradiso.2009.01.028

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Reference TypeJournal (article/letter/editorial)
TitleStatistical analysis of low-level material screening measurements via gamma-spectroscopy
JournalApplied Radiation and Isotopes
AuthorsHeisel, M.Author
Kaether, F.Author
Simgen, H.Author
Year2009 (May)Volume67
PublisherElsevier BV
DOIdoi:10.1016/j.apradiso.2009.01.028Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9743527Long-form Identifiermindat:1:5:9743527:3
GUID0
Full ReferenceHeisel, M., Kaether, F., Simgen, H. (2009) Statistical analysis of low-level material screening measurements via gamma-spectroscopy. Applied Radiation and Isotopes, 67. 741-745 doi:10.1016/j.apradiso.2009.01.028
Plain TextHeisel, M., Kaether, F., Simgen, H. (2009) Statistical analysis of low-level material screening measurements via gamma-spectroscopy. Applied Radiation and Isotopes, 67. 741-745 doi:10.1016/j.apradiso.2009.01.028
In(n.d.) Applied Radiation and Isotopes Vol. 67. Elsevier BV

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