Reference Type | Journal (article/letter/editorial) |
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Title | Measurement of the 109Cd half-life |
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Journal | Applied Radiation and Isotopes |
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Authors | Van Ammel, R. | Author |
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Pommé, S. | Author |
Paepen, J. | Author |
Sibbens, G. | Author |
Year | 2011 (May) | Volume | 69 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/j.apradiso.2011.01.020Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9744530 | Long-form Identifier | mindat:1:5:9744530:4 |
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GUID | 0 |
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Full Reference | Van Ammel, R., Pommé, S., Paepen, J., Sibbens, G. (2011) Measurement of the 109Cd half-life. Applied Radiation and Isotopes, 69. 785-789 doi:10.1016/j.apradiso.2011.01.020 |
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Plain Text | Van Ammel, R., Pommé, S., Paepen, J., Sibbens, G. (2011) Measurement of the 109Cd half-life. Applied Radiation and Isotopes, 69. 785-789 doi:10.1016/j.apradiso.2011.01.020 |
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In | (n.d.) Applied Radiation and Isotopes Vol. 69. Elsevier BV |
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