Reference Type | Journal (article/letter/editorial) |
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Title | From the Phenix irradiation end to the analytical results: PROFIL R target destructive characterization |
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Journal | IOP Conference Series: Materials Science and Engineering |
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Authors | Ferlay, Gilles | Author |
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Dancausse, Jean-Philippe | Author |
Leveque, Pierre | Author |
Eymard, Serge | Author |
Carre, Dominique | Author |
Bienvenu, Philippe | Author |
Guy, Christophe | Author |
Gautier, Céline | Author |
Isnard, Hélène | Author |
Goutelard, Florence | Author |
Bourdot, Patrick | Author |
Boucher, Lionel | Author |
Bonnerot, Jean-Marc | Author |
Year | 2010 (March 1) | Volume | 9 |
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Publisher | IOP Publishing |
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DOI | doi:10.1088/1757-899x/9/1/012021Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9774507 | Long-form Identifier | mindat:1:5:9774507:3 |
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GUID | 0 |
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Full Reference | Ferlay, Gilles, Dancausse, Jean-Philippe, Leveque, Pierre, Eymard, Serge, Carre, Dominique, Bienvenu, Philippe, Guy, Christophe, Gautier, Céline, Isnard, Hélène, Goutelard, Florence, Bourdot, Patrick, Boucher, Lionel, Bonnerot, Jean-Marc (2010) From the Phenix irradiation end to the analytical results: PROFIL R target destructive characterization. IOP Conference Series: Materials Science and Engineering, 9. 12021pp. doi:10.1088/1757-899x/9/1/012021 |
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Plain Text | Ferlay, Gilles, Dancausse, Jean-Philippe, Leveque, Pierre, Eymard, Serge, Carre, Dominique, Bienvenu, Philippe, Guy, Christophe, Gautier, Céline, Isnard, Hélène, Goutelard, Florence, Bourdot, Patrick, Boucher, Lionel, Bonnerot, Jean-Marc (2010) From the Phenix irradiation end to the analytical results: PROFIL R target destructive characterization. IOP Conference Series: Materials Science and Engineering, 9. 12021pp. doi:10.1088/1757-899x/9/1/012021 |
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In | (n.d.) IOP Conference Series: Materials Science and Engineering Vol. 9. IOP Publishing |
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