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Jebbari, N, Ajili, M, Guasch, C, Kamoun, N, Bennaceur, R (2010) Effect of annealing on structural and electrical properties of ZnO and In2S3:Al thin layers. IOP Conference Series: Materials Science and Engineering, 13. 12007pp. doi:10.1088/1757-899x/13/1/012007

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Reference TypeJournal (article/letter/editorial)
TitleEffect of annealing on structural and electrical properties of ZnO and In2S3:Al thin layers
JournalIOP Conference Series: Materials Science and Engineering
AuthorsJebbari, NAuthor
Ajili, MAuthor
Guasch, CAuthor
Kamoun, NAuthor
Bennaceur, RAuthor
Year2010 (November 1)Volume13
PublisherIOP Publishing
DOIdoi:10.1088/1757-899x/13/1/012007Search in ResearchGate
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Mindat Ref. ID9774883Long-form Identifiermindat:1:5:9774883:0
GUID0
Full ReferenceJebbari, N, Ajili, M, Guasch, C, Kamoun, N, Bennaceur, R (2010) Effect of annealing on structural and electrical properties of ZnO and In2S3:Al thin layers. IOP Conference Series: Materials Science and Engineering, 13. 12007pp. doi:10.1088/1757-899x/13/1/012007
Plain TextJebbari, N, Ajili, M, Guasch, C, Kamoun, N, Bennaceur, R (2010) Effect of annealing on structural and electrical properties of ZnO and In2S3:Al thin layers. IOP Conference Series: Materials Science and Engineering, 13. 12007pp. doi:10.1088/1757-899x/13/1/012007
In(n.d.) IOP Conference Series: Materials Science and Engineering Vol. 13. IOP Publishing

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