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Liu, Y Q, Tainoff, D, Boukhari, M, Richard, J, Barski, A, Bayle-Guillemaud, P, Hadji, E, Bourgeois, O (2014) Sensitive 3-omega measurements on epitaxial thermoelectric thin films. IOP Conference Series: Materials Science and Engineering, 68. 12005pp. doi:10.1088/1757-899x/68/1/012005

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Reference TypeJournal (article/letter/editorial)
TitleSensitive 3-omega measurements on epitaxial thermoelectric thin films
JournalIOP Conference Series: Materials Science and Engineering
AuthorsLiu, Y QAuthor
Tainoff, DAuthor
Boukhari, MAuthor
Richard, JAuthor
Barski, AAuthor
Bayle-Guillemaud, PAuthor
Hadji, EAuthor
Bourgeois, OAuthor
Year2014 (November 26)Volume68
PublisherIOP Publishing
DOIdoi:10.1088/1757-899x/68/1/012005Search in ResearchGate
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Mindat Ref. ID9777778Long-form Identifiermindat:1:5:9777778:0
GUID0
Full ReferenceLiu, Y Q, Tainoff, D, Boukhari, M, Richard, J, Barski, A, Bayle-Guillemaud, P, Hadji, E, Bourgeois, O (2014) Sensitive 3-omega measurements on epitaxial thermoelectric thin films. IOP Conference Series: Materials Science and Engineering, 68. 12005pp. doi:10.1088/1757-899x/68/1/012005
Plain TextLiu, Y Q, Tainoff, D, Boukhari, M, Richard, J, Barski, A, Bayle-Guillemaud, P, Hadji, E, Bourgeois, O (2014) Sensitive 3-omega measurements on epitaxial thermoelectric thin films. IOP Conference Series: Materials Science and Engineering, 68. 12005pp. doi:10.1088/1757-899x/68/1/012005
In(n.d.) IOP Conference Series: Materials Science and Engineering Vol. 68. IOP Publishing

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