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Llovet, X, Salvat, F (2016) PENEPMA: a Monte Carlo programme for the simulation of X-ray emission in EPMA. IOP Conference Series: Materials Science and Engineering, 109. 12009pp. doi:10.1088/1757-899x/109/1/012009

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Reference TypeJournal (article/letter/editorial)
TitlePENEPMA: a Monte Carlo programme for the simulation of X-ray emission in EPMA
JournalIOP Conference Series: Materials Science and Engineering
AuthorsLlovet, XAuthor
Salvat, FAuthor
Year2016 (February 9)Volume109
PublisherIOP Publishing
DOIdoi:10.1088/1757-899x/109/1/012009Search in ResearchGate
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Mindat Ref. ID9780413Long-form Identifiermindat:1:5:9780413:6
GUID0
Full ReferenceLlovet, X, Salvat, F (2016) PENEPMA: a Monte Carlo programme for the simulation of X-ray emission in EPMA. IOP Conference Series: Materials Science and Engineering, 109. 12009pp. doi:10.1088/1757-899x/109/1/012009
Plain TextLlovet, X, Salvat, F (2016) PENEPMA: a Monte Carlo programme for the simulation of X-ray emission in EPMA. IOP Conference Series: Materials Science and Engineering, 109. 12009pp. doi:10.1088/1757-899x/109/1/012009
In(n.d.) IOP Conference Series: Materials Science and Engineering Vol. 109. IOP Publishing

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Llovet, X, Salvat, F (2018) Influence of simulation parameters on the speed and accuracy of Monte Carlo calculations using PENEPMA. IOP Conference Series: Materials Science and Engineering, 304. 12009pp. doi:10.1088/1757-899x/304/1/012009
Sánchez-Gonzalo, D, Llovet, X, Graciani, R, Salvat, F (2018) A tracking algorithm for Monte Carlo simulation of surface roughness in EPMA measurements. IOP Conference Series: Materials Science and Engineering, 304. 12015pp. doi:10.1088/1757-899x/304/1/012015
Salvat, F, Llovet, X (2018) Monte Carlo simulation and fundamental quantities. IOP Conference Series: Materials Science and Engineering, 304. 12014pp. doi:10.1088/1757-899x/304/1/012014
Richter, S, Pinard, P T (2016) Combined EPMA, FIB and Monte Carlo simulation: a versatile tool for quantitative analysis of multilayered structures. IOP Conference Series: Materials Science and Engineering, 109. 12014pp. doi:10.1088/1757-899x/109/1/012014
Llovet, Xavier, Salvat, Francesc (2017) PENEPMA: A Monte Carlo Program for the Simulation of X-Ray Emission in Electron Probe Microanalysis. Microscopy and Microanalysis, 23 (3). 634-646 doi:10.1017/s1431927617000526
Escuder, J A, Salvat, F, Llovet, X, Donovan, J J (2010) Numerical correction for secondary fluorescence across phase boundaries in EPMA. IOP Conference Series: Materials Science and Engineering, 7. 12008pp. doi:10.1088/1757-899x/7/1/012008
Winkelmann, A, Nolze, G, Vos, M, Salvat-Pujol, F, Werner, W S M (2016) Physics-based simulation models for EBSD: advances and challenges. IOP Conference Series: Materials Science and Engineering, 109. 12018pp. doi:10.1088/1757-899x/109/1/012018
Takahashi, H, Murano, T, Takakura, M, Asahina, S, Terauchi, M, Koike, M, Imazono, T, Koeda, M, Nagano, T (2016) Development of soft X-ray emission spectrometer for EPMA/SEM and its application. IOP Conference Series: Materials Science and Engineering, 109. 12017pp. doi:10.1088/1757-899x/109/1/012017
Moro, D, Valdre, G (2016) Effect of shape and thickness of asbestos bundles and fibres on EDS microanalysis: A Monte Carlo simulation. IOP Conference Series: Materials Science and Engineering, 109. 12011pp. doi:10.1088/1757-899x/109/1/012011
Fujii, Yoshikazu (2011) Improved x-ray reflectivity calculations for rough surfaces and interfaces. IOP Conference Series: Materials Science and Engineering, 24. 12009pp. doi:10.1088/1757-899x/24/1/012009
McSwiggen, P (2014) Characterisation of sub-micrometre features with the FE-EPMA. IOP Conference Series: Materials Science and Engineering, 55. 12009pp. doi:10.1088/1757-899x/55/1/012009
 
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